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MULTI-CORE ATPG

MULTI-CORE ATPG. 專題生 : 林美綺、陳思妤 指導教授 : 曾王道 . 研究動機、問題. WHAT IS ATPG?. Automatic Test Pattern Generation ( 以下簡稱 ATPG) 自動測試模式生成 ( 器 ) ，是一個電子設計自動化方法，用於尋找輸入（或測試）序列，當應用到電路，使測試人員正確區分電路故障電路的行為和行為所造成的缺陷。

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MULTI-CORE ATPG

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  1. MULTI-COREATPG 專題生:林美綺、陳思妤 指導教授:曾王道 

  2. 研究動機、問題

  3. WHAT IS ATPG? • Automatic Test Pattern Generation(以下簡稱ATPG)自動測試模式生成(器)，是一個電子設計自動化方法，用於尋找輸入（或測試）序列，當應用到電路，使測試人員正確區分電路故障電路的行為和行為所造成的缺陷。 • 　　隨著超大型積體電路的發展，晶片設計複雜度增加，測試晶片的困難度也跟著增加，測時晶片時的正確性和花費時間也愈來愈重要，在設計初期就該考量。由於多核心處理器是在目前普遍使用的計算機系統，而平行ATPG可能是一個好辦法來改善ATPG的執行時間問題。

  4. 研究目標

  5. 本次實驗主要是利用PODEM演算法設計一個ATPG程式，在多核心處理器的環境下，產生一些高錯誤涵蓋率及執行速度快的test pattern來測試組合邏輯電路功能性和規格符合度。我們的目標是建立一個快速的ATPG程序運行時，很少產生模式和高故障覆蓋率在給定的多核心計算環境。

  6. 實驗流程

  7. STEP1　讀取輸入的資訊 • STEP2　轉譯輸入的電路格式 • STEP3　用PODEM演算法執行ATPG • STEP4　產生測試樣本並儲存 • STEP5　將產生的測試樣本分割成多個測試樣本 • STEP6　將多個平行執行緒上每個分割後的測試樣本分別放到執行 • STEP7　每個執行緒產生各自的測試結果

  8. 實驗流程

  9. 實驗架構

  10. ＰＯＤＥＭ演算法

  11. PODEM http://www.cedcc.psu.edu/ee497i/rassp_43/sld047.htm

  12. PODEM • After an input assignment is selected, a simulation like process is performed to determine what values on circuit nodes are implied by the new input value. If, after implication, a test is no longer possible (fault set a s-a value, no propagation path, etc.) the opposite value for that input is tried. If that also precludes a test, the last input value tried is “popped off of the stack” and the alternate value is tried. This process of “backtracking” insures that PODEM is complete.

  13. 錯誤模擬 • Fault coverage =

  14. 錯誤模擬

  15. THE END

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