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Noise Simulation on RPCs

Noise Simulation on RPCs. Andrés Leonardo Cabrera Mora High Energy Physics Group Universidad de los Andes. ¿ What we are simulating ?. Resistive Plate Chambers. Geometry. First Aproximation. Polyethylene (0.2 mm) Graphite (0.2 mm) Bakelite (2 mm) Gas C 2 H 2 F 4 (2 mm)

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Noise Simulation on RPCs

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  1. Noise Simulation on RPCs Andrés Leonardo Cabrera Mora HighEnergyPhysicsGroup Universidad de los Andes

  2. ¿Whatwe are simulating? ResistivePlateChambers

  3. Geometry FirstAproximation • Polyethylene (0.2 mm) • Graphite (0.2 mm) • Bakelite (2 mm) • Gas C2H2F4 (2 mm) • Aluminum (strips)(0.04 mm) • Air • Localized Electric Field (4.5 kV/mm)

  4. Implementation • Particles: photons, electrons, positrons, muons and antimuons. • Processes: Compton Scattering, Photo Electric Effect, Gamma Conversion, Multiple Scattering, Ionization, Bremsstrahlung, Positron Annihilation and Pair Production. • Results: Histograms, Scatter Plots, Angles Distribution and Distance Distribution.

  5. Conditions on the Simulation • Incidence of ten millions of muons through a Double RPC (perpendicular, fixed point) • Localized field in the region of the gas -4.5 kV/mm in the z axis (negative) • The results show electrons that come from photons in the gas region

  6. Results

  7. ElectronDistanceDistribution Counts Distance Distribution X (cm)

  8. ElectronEnergyDistribution Counts Energy Distribution (MeV)

  9. Angular Distribution Z (positive) Cos (Ѳ) = 1 Cos (Ѳ) = -1

  10. ElectronCos (Ѳ)Distribution Counts Cos (Ѳ) Distribution

  11. ElectronΦ Angular Distribution Counts Φ Distribution (Deg)

  12. ScatterPlot Y vs X Y (mm) X (mm)

  13. Other Results

  14. Positive Electric Field (4.5 kV/mm en la dirección positiva del eje z)

  15. Negative Electric Field (4.5 kV/mm en la dirección negativa del eje z)

  16. RPC withIron

  17. RPC with aluminium

  18. Change in the incidence of particles • Distribution of energies • Incidence from different angles and points.

  19. Manage of Information • Twiki in english/spanish http://twiki.org/cgi-bin/view/Sandbox/AndresCabreraSandbox

  20. Conclusions • The incidence of ten millions of muons produce a 0.09% (9242) of electrons that come from photons. • Only 0.09% (9) of electrons are produced to more than 10 cm of the point of incidence.

  21. Conclusions • Only 2.7% (257) electrons are produced to more than 2.4 cm (1.2 cm) of the point of incidence.

  22. ElectronDistanceDistribution Counts Distance Distribution X (cm)

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