'Die yield' presentation slideshows

CS151B Computer Systems Architecture Winter 2002 TuTh 2-4pm - 2444 BH

CS151B Computer Systems Architecture Winter 2002 TuTh 2-4pm - 2444 BH. Lecture 5 - ALU Design I: Adder and Simple Logic Operations. Instructor: Prof. Jason Cong <cong@cs.ucla.edu>. Basis of Evaluation. Cons. Pros. very specific non-portable difficult to run, or measure

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Lecture 2: Measuring Performance/Cost/Power

Lecture 2: Measuring Performance/Cost/Power. Today’s topics: (Sections 1.6, 1.4, 1.7, 1.8) Quantitative principles of computer design Measuring cost Real industrial examples. Summarizing Performance. Recall discussion on AM versus GM GM: does not require a reference machine, but does

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Lecture 2: Measuring Performance/Cost/Power

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CS 6290 Intro & Trends

CS 6290 Intro & Trends. Milos Prvulovic - Fall 2007. Prerequisites. I will assume you have detailed knowledge of Pipelining Classic 5-stage pipeline, pipeline hazards, stalls, etc. Caches Tag/Index/Offset, hit/miss, set-associativity, replacement policies, write-thorugh/write-back, etc.

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Lecture 2: System Metrics and Pipelining

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Lecture 2: System Metrics and Pipelining

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Lecture 2: System Metrics and Pipelining

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Lecture 2: System Metrics and Pipelining

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Computer Architecture

Computer Architecture. Part I-B: Cost. Cost. Cost-sensitive designs are of growing importance. Learning curve: manufacturing costs decrease over time The learning curve is best measured by a change in yield - the percentage of manufactured devices that survives the testing procedure.

208 views • 9 slides