'Focused ion beam milling' presentation slideshows

Scanning probe microscopy (SPM) and lithography

1.24k views • 63 slides

Nanophotonics Prof. Albert Polman Center for Nanophotonics FOM-Institute AMOLF, Amsterdam

Nanophotonics Prof. Albert Polman Center for Nanophotonics FOM-Institute AMOLF, Amsterdam Debye Institute, Utrecht University. Nanophotonics: defined by its applications communications technology lasers solid-state lighting data storage lithography (bio-)sensors

330 views • 29 slides

Nanophotonics Prof. Albert Polman Center for Nanophotonics FOM-Institute AMOLF, Amsterdam Debye Institute, Utrecht Unive

Nanophotonics Prof. Albert Polman Center for Nanophotonics FOM-Institute AMOLF, Amsterdam Debye Institute, Utrecht University. Nanophotonics: defined by its applications communications technology lasers solid-state lighting data storage lithography (bio-)sensors

289 views • 28 slides

Nanofabrication and Devices (in ECE and ME Departments)

Nanofabrication and Devices (in ECE and ME Departments). John Melngailis Department of Electrical and Computer Engineering & Institute for Research in Engineering and Applied Physics. University of Maryland, College Park. Nanofabrication.

444 views • 26 slides

408 views • 24 slides

ME 398 SEMINAR PRESENTATION

ME 398 SEMINAR PRESENTATION. By Viraj Vajratkar 05D10021 Under the guidance of Prof. Joshi Dept. of Mechanical Engineering, IIT Bombay, April 2008. TOPIC : FIB (Focused Ion Beam) for Nanomachining (Milling). Brief Overview. Scope of FIB (Focused Ion Beam)

367 views • 20 slides

FIB at Glancing Angle of Incidence

PBS&T. Valery Ray vray@partbeamsystech.com. FIB at Glancing Angle of Incidence. Outline. Ion Sputtering @ Glancing Angle of Incidence Line Etching @ Glancing Angle Etch Enhancement @ Glancing Angle ? Directional Enhancement Experiment Volume and Depth Experiment

344 views • 11 slides

Presented by Yiin-Kuen(Michael) Fuh 2007/3/19

Electrochemical Nanoimprinting with Solid-State Superionic Stamps Keng H. Hsu, Peter L. Schultz, Placid M. Ferreira, and Nicholas X. Fang*, UIUC NANO LETTERS 2007 Vol. 7, No. 2 446 - 451. Presented by Yiin-Kuen(Michael) Fuh 2007/3/19. Outline. Introduction & motivation

184 views • 9 slides

Superlattice Photocathode Damage Marcy Stutzman and the Center for Injectors and Sources

Surface Analysis Goals Which residual gasses limit photocathode lifetime? Why do we have surface charge limit? Why does SCL get worse with photocathode age? Does Be dopant migrate with heat cycles?.

127 views • 1 slides