'Parametric yield' presentation slideshows

Manufacturing-Aware Physical Design

1.44k views • 107 slides

Outline

Scope and Goals of Future Design-Through-Mask Integrations Advanced Reticle Symposium June 24, 2003 Andrew B. Kahng, UCSD CSE & ECE Departments email: abk@ucsd.edu URL: http://vlsicad.ucsd.edu. Outline. The Problem, Scope and Goals Example 1: Performance-Driven Fill

423 views • 29 slides

A cumulative distribution function-based method for yield optimization of CMOS ICs

A cumulative distribution function-based method for yield optimization of CMOS ICs. M . Yakupov*, D . Tomaszewski Division of Silicon Microsystem and Nanostructure Technology, Institute of Electron Technology, Warsaw, Poland * Currently MunEDA GmbH, Munich, Germany. Outline. Introduction

329 views • 25 slides

Toward Performance-Driven Reduction of the Cost of RET-Based Lithography Control

Toward Performance-Driven Reduction of the Cost of RET-Based Lithography Control. Dennis Sylvester (dennis@eecs.umich.edu), Jie Yang (Univ. of Michigan, Ann Arbor) Puneet Gupta, Andrew B. Kahng (UC San Diego). Outline . Trends in Mask Cost Design for Value

355 views • 24 slides

Robustness of SRAM Memories Universitat Politecnica de Catalunya (UPC) Barcelona Spain

Robustness of SRAM Memories Universitat Politecnica de Catalunya (UPC) Barcelona Spain Ioana Vatajelu. Overview Problem Statement SB-SI Method of Statistical Failure Analysis Failure Analysis of the 6T SRAM cell Parametric Yield of the 6T SRAM memory array Conclusions. Overview

391 views • 21 slides