'Test sequence length reductions' presentation slideshows

An Efficient Test Set Embedding Scheme with Reduced Test-Data Storage and

An Efficient Test Set Embedding Scheme with Reduced Test-Data Storage and Test Sequence Length Requirements for Scan-based Testing. D. Kaseridis 1 , E. Kalligeros 1 , X. Kavousianos 2 & D. Nikolos 1. 2 Dept. of Computer Science University of Ioannina, 45110, Ioannina, Greece.

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