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Fault Isolation Through Thermal Isolation Featuring the ICARUS 2001, Infra Red Spot-Heat Device

Fault Isolation Through Thermal Isolation Featuring the ICARUS 2001, Infra Red Spot-Heat Device. Brian D. Palmer, Sr. Engineer/GroupLeader EMC 2 Corporation, EQA, ESS Engineering 10 Avenue E, Hopkinton, MA 01748. EMC 2 Takes HALT/HASS Seriously. Memory/Director Debug Fixture.

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Fault Isolation Through Thermal Isolation Featuring the ICARUS 2001, Infra Red Spot-Heat Device

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  1. Fault Isolation Through Thermal IsolationFeaturing the ICARUS 2001, Infra Red Spot-Heat Device Brian D. Palmer, Sr. Engineer/GroupLeader EMC2 Corporation, EQA, ESS Engineering 10 Avenue E, Hopkinton, MA 01748

  2. EMC2 Takes HALT/HASS Seriously

  3. Memory/Director Debug Fixture

  4. EPO Debug Fixture

  5. CommBoard Debug Fixture

  6. 36th Annual Spring Reliability Symposium Reference IEEE Paper, April 23 1998 Accelerated Test Techniques (HALT/HASS): • Reduce product development cycle-time, reduce infant mortality, and improve long-term reliability. • Produces failures. However, troubleshooting, debugging and failure analysis of complex electronic hardware is anything but fast. • Requires accelerated means of isolating the failure mode to the component level.

  7. 36th Annual Spring Reliability Symposium Reference IEEE Paper, April 23 1998

  8. Discrete Heater Application

  9. Taking The Failure Out of the Chamber • IEEE paper dealt with working inside the chamber. • If you can get the failure out of the chamber, it will be much simpler and practical to troubleshoot, debug and analyze. • Introducing the ICARUS “2001” Infrared Spot-Heat Device, by GDAT Ltd.

  10. ICARUS “2001” - Infrared Technology

  11. Why Not Just Use A Heatgun?

  12. Demonstration of ICARUS “2001” Control and Thermal Isolation Capabilities

  13. At a Tc of +90ºC, this debug/analysis effort would be impossible to perform inside a chamber environment given test cable lengths and their thermal limits.

  14. ICARUS “2001” Heats Component As the IC would Naturally Heat Itself

  15. Safe and Effective While Reducing Time Between Fault Detection and Corrective Action

  16. Closing Slide

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