VLSI Testing Lecture 14: Built-In Self-Test
VLSI Testing Lecture 14: Built-In Self-Test. Dr. Vishwani D. Agrawal James J. Danaher Professor of Electrical and Computer Engineering Auburn University, Alabama 36849, USA vagrawal@eng.auburn.edu http://www.eng.auburn.edu/~vagrawal IIT Delhi, July 31, 2012, 4:00-5:00PM. Contents.
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