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Introduction To Focused Ion Beam Nanometrology_PDF`
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Introduction to Focused Ion Beam Nanometrology David C. Cox 1 / 5
Publisher : Morgan & Claypool Publishers Release Date : 2 / 5
ISBN : 1681740206 Author : David C. Cox Download Here http://bit.ly/ebook_apetiga 3 / 5
This book describes modern focused ion beam microscopes and techniques and how they can be used to aid materials metrology and as tools for the fabrication of devices that in turn are used in many other aspects of fundamental metrology. Find the Full PDF Here http://bit.ly/ebook_apetiga 4 / 5
You Can Download the PDF Here http://bit.ly/ebook_apetiga Powered by TCPDF (www.tcpdf.org) 5 / 5