Let’s buy the smartness – Optical metrology

1. Let’s buy the smartness – Optical metrology "Metrology is the science of measurement, which includes theoretical and experimental conclusions at any level of uncertainty in all fields of science and technology." Metrology is, without a doubt, the foundation of all practical scientific endeavours. Metrology is important in almost every aspect of daily life, including practical science, technology, and engineering. It also includes measurements, such as vision measurement machine, optical measurement equipment, high accuracy measurement machine, die location measurements, and die shift measurements. Let's take a broad look at some optical metrology features. Is Metrology uniquely challenged by Multiple Chip Modules? A multi-chip module is an electrical package made up of several integrated circuits (ICs) combined into one unit (MCM). A Multiple Chip Module can perform multiple functions as a single unit. The substrate on which the various Multiple Chip Module components are installed is wire-bonded, tape-bonded, or flip-chip-bonded to the surface of the substrate's bare dies. The inspection of multi-chip modules (MCM) can frequently present particularly difficult metrology requirements due to the need to precisely control numerous different factors for multiple die on a common substrate, such as die location measurement, die height at the corners, verification of wire counts for each die, and die-to-substrate alignment characteristics. What VIEW is video monitoring – Optical metrology For any need for exceptionally high precision measurement, VIEW offers the ideal answer. VIEW non-contact measuring systems use sub-pixel image feature detection with either field- of-view (FOV) or point-to-point (PTP) setups for excellent accuracy and reproducibility.

2. There are the main view’s optical metrology systems ● BENCHMARK 250 - A compact, high-accuracy dimensional. ● BENCHMARK 300 - High-performance floor model optical metrology system. ● BENCHMARK 450 - High-value, high-accuracy dimensional metrology system. ● BENCHMARK XLT - Extra-large format dimensional metrology system. ● PINNACLE 250 - A high throughput, high-accuracy dimensional metrology system. ● PINNACLE PLUS - Elevates Pinnacle performance to the next level. ● SUMMIT 600/625/800 - A large travel, high-accuracy dimensional measurement system. ● MICROLINE AF - Offers exceptional line width and overlay measurement capability. ● MICROLINE AF PLUS - Offers exceptional line width and overlay measurement capability. https://viewmm.com/ Contact US: https://viewmm.com/en/support/how-to-contact-us/ Email ID: sales@viewmm.com