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STIL Support

STIL Support. IMS Design and Test Software, Oct 2002. SOC Device Tests Supported Today. Functional tests Digital patterns from Verilog testbenches like VCS Analog tests are “handcrafted” by test department Structural tests Scan based (TetraMAX Output) Iddq

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STIL Support

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  1. STIL Support IMS Design and Test Software, Oct 2002

  2. SOC Device Tests Supported Today • Functional tests • Digital patterns from Verilog testbenches like VCS • Analog tests are “handcrafted” by test department • Structural tests • Scan based (TetraMAX Output) • Iddq • Digital (SoCBIST), Memory, Mixed-Signal BIST

  3. IMS Short Term STIL Strategy • Support STIL input for DFT flows • Full Language parser • DFT data subset in practice • CTL supported • Input from all DFT tools • Validate STIL output to 1450 spec standard • Support ATE-specific variants

  4. Functional (VCS) VCD Cyclize Tester Bridge Test PGM Data base Structural (TetraMAX) WGLSTIL TESTDEBUG TESTDEVELOPMENT DESIGN The IMS TestDeveloper Flow • Design simulation output must be timed and ATE optimized • Structural and functional tests are combined into one test file • A “Bridge” creates specific tester source data IMS flow simplifies complex tasks Standardized process shortens test development time Supplements in-house resources

  5. Advanced Test DevelopmentTestDeveloper™ Test Debug on the DesktopVirtualTester™ • Ando • Advantest T33xx, T66xx, T65xx • Agilent 83000, 93000, 94000 • Credence SC, Duo/Quartet/Octet • Teradyne J750, J971/3, A5, Catalyst, Tiger • IMS ATS, XTS, FT, Vanguard • NPTest ITS9000 • LTX • SZ Test Systeme M3610, M3650, Piranha, Falcon, Kodiak Supported ATE Product Families And Additional Tester Support in Development • Advantest T3340, T6600 • Agilent 83000, 93000 • Credence Kalos & Quartet/Octet • Teradyne J750, J971/3, Catalyst/Tiger • Versatest V1000, V1300 • IMS Vanguard • NPTest ITS9000 • SZ Test Systeme M3650, Piranha, Falcon, Kodiak

  6. STIL Test Construct Advantages • Flexible Signal group and attribute definition • Hierarchical and multi-track waveform tables • Spec block & Selector block specifies min/typ/max, etc. • Print-on-change pattern data • Compact pattern data character representation • MatchLoop, BreakPoint, GoTo, IddqTestPoint support • Pattern Exec & Control block to select from multiple timing and waveform blocks • Scan Structure efficiency using Procedures and Macros • User-defined extensibility; User Keywords & User Functions

  7. In Summary • TestDeveloper delivers the flow to enable the current STIL efforts to be productive • TestDeveloper supports the complete (functional and structural) test pattern, timing and connectivity files for engineering and production test systems • IMS DaTS will continue its involvement in the STIL standards efforts

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