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Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction

Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction. D. Pesquera , F. Sanchez, G. Herranz , J. Fontcuberta ICMAB, Barcelona. X. Marti , V. Holy Charles University, Prague P. Ferrer , T. Schulli ESRF, Grenoble J. Herrero-Albillos

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Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction

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  1. Artifacts in the characterization of skin layers and ultrathin films by X-ray diffraction D. Pesquera, F. Sanchez, G. Herranz, J. Fontcuberta ICMAB, Barcelona X. Marti, V. Holy Charles University, Prague P. Ferrer, T. Schulli ESRF, Grenoble J. Herrero-Albillos BESSY, Berlin J. Narvaez, G. Catalan CIN2, Barcelona N. Barrett, CEA, Gif-sur-Yvette M. Alexe MPI, Halle Out-of-plane parameter? Thin film, t < 10 nm Substrate 1 2 Grazing incidence diffraction Conventional XRD xavi.mr@gmail.com EMRS, Warsaw, SEPT 2011

  2. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  3. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  4. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  5. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  6. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  7. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Incoming X-rays Thin film, t < 10 nm Substrate

  8. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com |ESL(w)|2 = |ES(w) + EL(w)|2 |E0SL(w)|2 = |ES(w)|2 + |EL(w)|2

  9. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com |ESL(w)|2 = |ES(w) + EL(w)|2 |E0SL(w)|2 = |ES(w)|2 + |EL(w)|2

  10. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com How relevant this issue could be (1/2): Samples grown at ICMAB

  11. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com |ESL(w)|2 = |ES(w) + EL(w)|2 |E0SL(w)|2 = |ES(w)|2 + |EL(w)|2 Samples grown at ICMAB

  12. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com How relevant this issue could be (1/2): Samples grown at ICMAB

  13. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com I0 How relevant this issue could be (2/2): SRO1 BTO SRO2 STO Measured peak is at … …w = 22.24 deg The corresponding “c” is at … 21.84 deg !!! Samples courtesy of A. Gruverman

  14. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com I0 How relevant this issue could be (2/2): SRO1 BTO SRO2 STO Apparent lattice parameter Measured peak is at … …w = 22.24 deg The corresponding “c” is at … 21.84 deg !!! True lattice parameter Samples courtesy of A. Gruverman

  15. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com I0 How relevant this issue could be (2/2): 21.84 deg  4.14 Angstrom (fit) 22.24 deg  4.07 Angstrom (peak-pick) SRO1 BTO SRO2 STO Measured peak is at … …w = 22.24 deg The corresponding “c” is at … 21.84 deg !!! FE Measurement courtesy of P. Zubko Sample courtesy of A. Gruverman

  16. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Scenario # 2: a thin skin layer of a substrate • Small changes of the out-of-plane parameter • …and confined in a few (?) nm thick topmost surface Ei αi Single crystal http://henke.lbl.gov/optical_constants/

  17. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Correction for refraction

  18. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com For the particular case of BiFeO3, for instance: To circumvent refraction we scanned both energy and incidence angle Color scale indicates the information depth

  19. Measured Corrected BULK SKIN Changing the energy (no refraction correction required) Q Q EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com

  20. Measured Corrected BULK SKIN Changing the energy (no refraction correction required) Changing the angles EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com

  21. EMRS, Warsaw, SEPT 2011 xavi.mr@gmail.com Concluding remarks For the extraction of lattice parameters it is highly recommended to fit simultaneously both the substrate and the thin film using a dynamical or semi-kinematical model. For the determination small changes of lattice parameters, in grazing incidence geometry, changing the energy may be more useful than changing the angles Thank you very much for your attention! xavi.mr@gmail.com

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