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Built-In Test Software for Deformable Mirror High Voltage Drivers. Jianwei Zhou Home Institution: University of Hawaii at Manoa CfAO Akaimai Internship 2008 Subaru Telescope Mentor: Stephen Colley
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Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution: University of Hawaii at Manoa CfAO Akaimai Internship 2008 Subaru Telescope Mentor: Stephen Colley Funding provided by the Center for Adaptive Optics through its National Science Foundation Science and Technology Center grant (#AST-987683)
Today’s Presentation • Project Intro • Problems Encountered • Approaches
Project Overview • Design Built-InTest (BIT) software for deformable mirror high voltage driver in the Subaru LGSAO system. Measurements performed by BIT circuitry • Input Voltages • Output Voltages • Power Supply Voltages • Board Temperature
HV Driver Subsystem • The HV driver subsystem in the Subaru LGSAO system consist of 10 HV Amplifier boards
High Voltage Amplifier Board HV Amplifiers Built-In Test
Built-In Test Circuit Main components: Analog Multiplexer (Mux) Analog-To-Digital Converter Microcontroller (PIC 16F877) Temperature Sensor BIT Circuit Mux Microcontroller Host Computer A/D Converter Temperature Sensor
Built-In Test Software • Program Language use: C Step 1: Program in C Step 2: Compile to Assembly language by PICC STD. Pros and cons • C is easier and much shorter than assembly language • Programming requires the knowledge of microcontroller
Problem Encountered I: understand the circuit
C compiler • Not compactable with certain computer system • Unidentified bug ( Insert of leading 0) • Special setting
Development tool • In-circuit Debugger • MPLAB-IDE
Communication • Communication between the chips on the built-in test circuit • Communication between the microcontroller and host computer ( I2C)
Approaches • Review the knowledge learnt in school ( programming, digital design, circuit analysis) • Search on Internet • Read the data sheet of the device • Get help from mentor