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CIS Testing Technology. 思衛科技 Jemmy Mobil Phone:0917866007 E-mail:jemmy_chen@jetek.com.tw. Basic Introduction CIS Function CIS Test Item CIS Test System Production Issue. Contents. -What is CIS -CIS Application -CIS Market. Basic Introduction. Digital camera. Digital camera. CCD.
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CIS Testing Technology 思衛科技 Jemmy Mobil Phone:0917866007 E-mail:jemmy_chen@jetek.com.tw
Basic Introduction CIS Function CIS Test Item CIS Test System Production Issue Contents
-What is CIS -CIS Application -CIS Market Basic Introduction
Digital camera Digital camera CCD CIS CCD CCD What is CIS CIS(CMOS Image Sensor)
Note PC PDA Mobile Phone Wristwatch Camera Digital Camera In-vehicle Camera CCD / CMOS Image Sensor Video Camera Security Camera Fingerprint/Pupil User Authentication Copy Machine Facsimile/Scanner CIS Application
-System Block CIS Function
System Block NTSC/PAL DSP Video Encoder CDS ADC AGC CMOS Image Sensor DVP (Digital Video Port) Interface Timing Generator Memory MIPI (Mobile Industry Processor Interface)
Passive Sensor: Advantage: Simple circuit(one transistor) Large sensor area Disadvantage: Loading is higher Random noise is big Active Sensor: Advantage: Electron convert voltage directly in each pixel Reduce radon noise Disadvantage: Small sensor area Amplifier character is different in each pixel Fixed pattern noise
Digital Control Logic • Timing generator • I2C Interface • Exposure control • Frame Rate control • Gain control • Image size control • Multi port output • --------
CDS CDS(Correlated Double Sampling) + _ Vout Vin Delay T
About Multi Port Output : Clk limit solution for big area sensor
1 Hsync 1 Hsync EnCoder Monochrome: Sync Color: Chroma Burst
DVP Waveform Diagram FEN: VSync LEN: HSync
Response Pixels • Output Signal(Internal ADC) :
DC/Function Test ADC Test Image Test(Dark,Standard Light,Saturation,Color) Image Processor Library CIS Test Item
Continuity Leakage Power Consumption DC Test CIS Test Item ADC Test • Offset • Gain • INL / DNL • THD • S / N Function Test • I2C Write/Read • DSP Pattern
Dark Mean/Std. Dark Row/Column Variation Dark uniformity DSNU(Dark Signal non-uniformity) Dark Defect Pixel Dark Cluster Dark Current Dark Test
Dark Current (Dark_level1-dark_level2)/(0.255-0.02) Dark_level1 : Exposure:255ms Dark_level2 : Exposure:20ms Response 20 255 Exposure Time(ms)
Defect Pixel Test Adjacent Defect Pixel Test Defect Test Wound Pixel Dead Pixel
Adjacent Defect(Cluster) Region Define
Build Convolution Filter Build Bed Pixel Map Cluster Judge Method Cluster Test Algorithm
Cluster Judge Method : CMOS Imager ΣXi Mean X 1/N N Frames Bad Pixel Map ConvolutionFilter Count Judge
Judge Method 1: For 3 * 3: * You can judge the relation of bed pixels by value Ex: 274
Judge Method 2: For 3 * 3: * If the value >10 , There are 3 bad pixels in the 3*3 area (don’t care relation of bad pixels)
Mean Level ( Light, R, G, B ) Std. ( Overall, R, G, B ) S/N ( Overall, R, G, B ) -FPN(Fixed Pattern Noise) -Random Noise Row/Column Variation (R, G, B ) Uniformity (R, G, B ) PRNU(Photon Response non-uniformity) Defect Pixel (Overall):Defect judge by R, G, B independently Cluster Ps1: G1, G2 maybe need to be separated Standard Light Test
Saturation Mean Level (Overall, R, G, B ) Dynamic range (R, G, B) 20 * log( V_sat / V_noise) Saturation Test
R (G, B)Mean Value in R(G, B) Light R (G, B)Std. in R(G, B) Light Prime Response in R(G, B) Light Cross Response in R(G, B) Light Color Frame Test
Prime Response in R Light (Light R Mean – Dark R Mean) / (Light Overall Mean – Dark Overall Mean) Cross Response in R Light ((Light G(B) Mean – Dark G(B) Mean) / (Light R Mean – Dark R Mean)
Micro-Lens On-chip Micro Lens Color Filter Photo Shielding Film Sensor Die
Normalize Micro Lens Shift By low pass filter:
Solution1 for Micro Lens Shift By HW(Pupil Lens)
Solution2 for Micro Lens Shift By SW Image Uniformize × ÷ ÷
System Structure IP Module Illuminator(Light Source) Main System Analog Module(option) Debug Tool CIS Test System
Main System Sync Control & Result Control Signal Sync IP Module (Frame Grabber included) Sync DUT Data Bus Light Source Data Analog Module Analog Waveform Prober / Handler System Structure
Docking method: Light source connect with testhead directly
AC Power Docking with Prober (Cable system) Testhead Cable system Top View PIB (Prober Interface Board) illuminator Prober
Docking with Handler (Cable system) Side View Cable system DIB (Device Interface Board Handler Testhead illuminator
Test Head IP Module 32 pins IP Cabinet Digital max. Image Frame Grabber Board IP Data I/F CRT & Keyboard IP Controller 5pins: Timing Control & Setup Tester Cabinet CRT & Keyboard DC Test Functions Master Clocks Digital Pins Digital Test Functions DC Pins DUT LF/HF/VHF Pins Analog Test Functions UIP TC Time Measurement Light Source Controller IP Module
Illuminator Light Source Structure AGC
Illuminator Specification • Multi Sites (CP: Depend on Illuminator Area Size • FT: Depend on Illuminator multi sites Design) • Area: Area Sensor >25*25 mm Line Sensor > 100*100 mm • LUX: W > 1000 LUX • Uniformity: < 3% For Blue Light
R/G/B/W Light (option) • Pattern Turret (option) • Shutter Turret • F-number • Calibration Table • External / Internal Type
(Lx max - Lx min) ((Lx max + Lx min)/2) / 2 Uniformity (+/- %) = *100 Light Source Uniformity Measure Method :