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Surface Characterization of .STM.Bi0.92Sb0.08.(111) with dI/dV map and QPI pattern

This study utilizes scanning tunneling microscopy (STM) to investigate the surface properties of .STM.Bi0.92Sb0.08.(111). The dI/dV map and quantum interference pattern (QPI) analysis provide valuable insights into the surface states and momentum fluctuations. The study also examines the scattering of surface states and the presence of charge inhomogeneity.

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Surface Characterization of .STM.Bi0.92Sb0.08.(111) with dI/dV map and QPI pattern

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  1. STM Bi0.92Sb0.08 (111) Surface

  2. dI/dV map – QPI pattern

  3. JDOS and SSP

  4. Spin Selection Probability Γ-M

  5. Dispersion – ARPES and FT-STS

  6. Charge Inhomogeneity

  7. Scattering of Surface States

  8. Spatial fluctuations of momentum

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