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Noise study

Noise study. 6/May/’13 Kazuki Motohashi - Tokyo Tech. Introduction. F12-02-02 ASSY. Noise on pixel should decrease when bias voltage is applied Because width of depletion zone changes with bias If bump is disconnected, this effect cannot be seen

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Noise study

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  1. Noise study • 6/May/’13 • Kazuki Motohashi - Tokyo Tech

  2. Introduction F12-02-02 ASSY • Noise on pixel should decrease when bias voltage is applied • Because width of depletion zone changes with bias • If bump is disconnected, this effect cannot be seen • We can get # disconnected bumps using information of ⊿Noise • ⊿Noise := |noise with HV – noise w/o HV| • Source scan not done in ASSY test • Current setting : If ⊿Noise is < 20 e, the bump is considered as disconnected • # disconnected bumps is estimated correctly with this procedure…? • To check, Made some distributions of ⊿Noise from 13 CNM, 13 FBK and 30 DC modules which tested in Genova ⊿Noise

  3. Module list 13 CNM 13 FBK 30 DC • Only left chips on DC modules are included in the histograms to deal with all modules using one code

  4. Noise Evaluation ASSY : +10 ℃ FLEX : - 10 ℃ Removedbad modulesof SC From disconnected bumps ~10% good pixels of FBK FLEX < 20 e !! From modules with low breakdown voltage Conclusion : ‘cut value’ of ⊿Noise < 20 e is valid for ASSY As for FLEX, we must use also information of source scan 4

  5. Backup

  6. Noise Evaluation - CNM - FBK - DC Noise without HV of DC Some peaks are here Due to feature of s-curve fit of STControl? 6 6

  7. Noise Evaluation ① Remove pixels with 0 noise ② Removebad modules Noise values of some pixels are 0 in results of noise scan without HV for DC - CNM (3D) - FBK (3D) - DC (Planar) Strange bump appears at 120 e (=noise mean with HV for DC) Cut bad modules to see the difference of the ‘flavors’ clearly We cannot set cut value on ⊿Noise to count # disconnected bumps…make cut value list for each flavors individually? 7

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