1 / 6

Automatic Fault Diagnosis --SE Workshop--

Automatic Fault Diagnosis --SE Workshop--. Rui Abreu. TRADER Project. T elevision R elated A rchitecture to D esign and E nhance R eliability Improve user perceived reliability of high-volume consumer electronics Test case: television platform from NXP Three main LoA Error Detection

ashlyn
Download Presentation

Automatic Fault Diagnosis --SE Workshop--

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Automatic Fault Diagnosis--SE Workshop-- Rui Abreu

  2. TRADER Project • Television Related Architecture to Design and Enhance Reliability • Improve user perceived reliability of high-volume consumer electronics • Test case: television platform from NXP • Three main LoA • Error Detection • Fault Diagnosis • Recovery

  3. Spectrum-based Fault Localization • Spectra for m runs • Error detection per run • Compare every column vector with the error vector similarity sj

  4. Error Detection • DIED: Dynamic Invariants for (automatic) Error Detection • Research question • How good are generic invariants as error detectors for SFL? • Two phases • Training: train the program to accept certain values • Execution: if value was not seen, run is set as failed

  5. Conclusions • SFL • Black-box approach: no models! • Low overhead, thus attractive for embedded systems • Quality of diagnosis is roughly 80% on average for the Siemens set (when using the reference program as error detector) • DIED • Simple and generic • Low overhead • Quality of diagnosis is identical to the one obtained with the reference program

  6. Future Work • Diagnose multiple software faults • Paper due to DX’08 and ASE’08 • Together with Johan de Kleer (PARC, USA) • Compare SFL with MBDs • Paper due to DX’08 (?) • Together with Markus Stumptner and Wolfgang Mayer (University of South Australia) • Improve the performance overhead of the automatic error detection

More Related