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Searching Scientific Databases. Eva Dimmock Customer Relationship Manager edimmock@iee.org.uk. Presentation Layout. Role of Scientific Databases – comparison Inspec Database - Content, Structure and Coverage Inspec on various platforms Value Added Fields
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Searching Scientific Databases Eva Dimmock Customer Relationship Manager edimmock@iee.org.uk
Presentation Layout • Role of Scientific Databases – comparison • Inspec Database • - Content, Structure and Coverage • Inspec on various platforms • Value Added Fields • - Bibliographic searching (Exercises) • - Special indexing searching (Exercises) • Support & Contact
Databases Full Text Resources Electronics Journals Electronic Books Reports Dissertations Internet Resources Directories (e.g. Yahoo) Information Gateways (e.g. EEVL. BUBL) Subject Catalogues Usenet News Electronic Resources
Clearly Defined Resources Comprehensive & Focused Search Easy or Advanced Interfaces Advanced Search Aids Fast & Efficient Search Cost Databases vs Web Resources
Primary Publishers Searchable full text journals Disadvantage: Need subscription access to each journal – Inspec can be accessed by anyone on pay-as-you-go Disadvantage: Need to know the indexing policy and editorial conventions of each journal – Inspec has consistency in approach to all items IEEE Xplore Only IEEE and IEE publications, 1988 to date Databases vs Full Text
Quality & Reliability Continuity Identifiable resources Size & Coverage Added-Value Search Facilities Databases - Important Features
What is Inspec? • Leading Multidisciplinary Database • Physics • Electrical & Electronics Engineering • Computing & Control Engineering • Information Technology for Business • Manufacturing & Production Engineering • Journals, Conferences and Other Documents • Global Coverage • International Recognition for High Quality
The IEE/Inspec • The Institution of Electrical Engineers • Established in 1871 • Learned Society (Not-For-Profit) • Largest Professional Engineering Society in • Europe • 140,000 members worldwide • Primary Publisher • (journals, books, conference proceedings) • Secondary Publisher: Inspec Fast-track to Innovation
Secondary Publishers Ei Compendex Covers all engineering disciplines but not Physics ISI Web of Science/Science Citation Index Covers general and applied science No conference coverage Cambridge Scientific Abstracts No longer on Dialog or DataStar 30 databases in Inspec subject areas Other Multidisciplinary Databases
IEE/nspec Where are we? Glasgow Belfast Dublin INSPEC is produced in STEVENAGE Cardiff London IEE is based in LONDON
Inspec Database Size • Contains over 8 Million Records • Nearly 8,000 records added every week • Covers 35 years of Electronic Data • Covers research from 140+ Countries • Over 3,400 Journals & 3,000 Other Publications
Journal articles 73 % • Conference proceedings 17 % • Conference papers in Journals 8 % • Others 2% 25 % Journals 73% Conferences 25% Others 2% Record Types • Others includes: • Book / Book Chapter • Reports • Patents (1969-76) • Dissertations
Physics Electronics & Electrical Engineering Computing & Control Manufacturing & Production Engineering IT for Business 4.7 million records 2.7 million records 2.1 million records 600,000 records 65,000 records Inspec Database Subjects Figures correct as of Jan 2004
Physics 4.7 million records A0 General A1 Elementary Particles A2 Nuclear Physics A3 Atomic & Molecular A4 Fundamental Physics A5 Plasmas & Discharges A6 Solid State, Non-electronic A7 Solid State, Electronic A8 Cross-disciplinary Physics A9 Geophysics & Astronomy
Electrical & Electronic 2.7 million B0 General, Maths and Materials B1 Circuits B2 Components, Electron Devices B3 Magnetic Devices & Materials B4 Optoelectronics B5 Electromagnetic Fields B6 Communications B7 Instruments & Applications B8 Power Systems
Computing & Control 2.1 M million C0 General Management C1 Systems & Control Theory C3 Control Technology C4 Numerical & Computer Theory C5 Computer Hardware C6 Computer Software C7 Computer Applications
Diverse Coverage laser printers Long-haul lasers [buyer's guide] computer games A principal cognitive precondition of successful child-computer interactions in the information society traffic control Traffic signal control by Egograms photography Color handling in panoramic photography radar Fully integrated automotive radar sensor with versatile resolution pacemakers Paradoxical undersensing at a high sensitivity in dual chamber pacemakers radiation effects Modeling natural space ionizing radiation effects on external materials environmental science Impact of science and technology on energy and environmental research and development nanotechnology Molecular motors: nature's nanomachines manufacturing Analysis of a decentralized production-inventory system
World-Wide Coverage Percent
World-Wide Coverage Percent
Inspec Top 25 Publishers Academic Press Japanese Journal Appl. Physics ACM Kluwer Academic Publishers AIP MAIK Nauka/Interperiodica Publishing Allerton Press Opt. Soc. America American Geophys. Union Plenum APS Science Press Astron. Soc. Pacific SPIE-Int. Soc. Opt. Eng. Elsevier Springer-Verlag Gordon & Breech Taylor & Francis IEE Univ. of Chicago Press IEEE Wiley IOP Publishing World Scientific Inst. Electron. Inf. & Commun. Eng.
Inspec Latest Developments • Rapid growth of full text linking infrastructure • 50 to 60% or current records have DOIs • XML file for 1969-2003 • Over 1 million of DOIs • Corrected Data • New E-section • XML archival file 1898-1969 • Original and enhanced indexing • Available for purchase or lease
CEDOCAR DataStar Dialog Ebsco EI EINS Fiz-Technik Web of Knowledge (ISI) KISTI OCLC Ovid Proquest Information Questel-Orbit ScienceDirect SilverPlatter STN Inspec Provides (Vendors)
Scientific Research • latest developments • current awareness • state of the art • prior art • reviews Technological forecasting Competitor tracking Typical uses
Universities Corporate Organisations Government Establishments InspecUsers
Help Desk In-House Training Seminars Inspec Documentation Inspec Website Customer Support
Help Desk: +44 (0)1438 767297 Fax: +44 (0)1438 742840 Web: www.iee.org/inspec/ E-mail: inspec@iee.org.uk Contacts