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Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits Author - Connor Reed Advisor – Dr. Qiaoyan Yu, Department of Electrical and Computer Engineering, UNH. Results. Image Test. Introduction. Bit-Flip # Test. Faulty Normal.
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Investigating Impact of Soft Errors in Advanced Encryption Standard (AES) Circuits Author - Connor Reed Advisor – Dr. Qiaoyan Yu, Department of Electrical and Computer Engineering, UNH Results Image Test Introduction Bit-Flip # Test Faulty Normal • Soft errors are caused by transient charge from radiation entering sensitive areas in computing devices. • -These errors can effect system operations, stored data in memory, or other hardware components. CBC CFB On chip, transistors are vulnerable to radiation [1] CFB Zoomed In Original Encrypted Decrypted Radiation types by energy level [3] OFB No Fault (top) vs Fault (bottom) Methods • Soft errors can be caused by certain types of radiation environments due to transistor use in computing devices. • AES can be vulnerable even with a single bit-flip. • -Encrypting/Decrypting images using single error injected AES shows potential risks for storage of high profile data. Summary Injected single errors during first round of AES (red circles) at various locations to 128 bit blocks (6200 unique fault locations) using Matlab Simulation What AES Practically does [4] Organizations use AES to encrypt data on hardware like this [5] References - Base AES Code - http://buchholz.hs-bremen.de/aes/aes.htm - [1] https://www.nufo.org/meetings/files/2012_Laura_Dominik.pdf [2] - [2] http://en.wikipedia.org/wiki/Block_cipher_mode_of_operation - [3] Ibe, E.; Toba, T.; Shimbo, K.; Taniguchi, H. "Fault-based reliable design-on-upper-bound of electronic systems for terrestrial radiation including muons, electrons, protons and low energy neutrons", On-Line Testing Symposium (IOLTS), 2012 IEEE 18th International, On page(s): 49 - 54 - [4] http://bityard.blogspot.com/2010/10/symmetric-encryption-with-pycrypto-part.html - [5] http://www.net-security.org/secworld.php?id=6531 Acknowledgments - This research was supported with funding from the National Science Foundation’s Research Experience for Teachers in Engineering Grant (ENG-1132648). [2] - Special thanks to Dr. Yu, her team of graduate students, and the UNH Leitzel Center