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Characterization Update (Part 1)

Characterization Update (Part 1). Slade J. Jokela, Igor V. Veryovkin, Alex V. Zinovev. Al 2 O 3 Films. Five samples have been tested Inconsistent results Most likely due to reconfiguring ammeter to protect from possible overvoltage SEY should be reexamined

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Characterization Update (Part 1)

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  1. Characterization Update (Part 1) Slade J. Jokela, Igor V. Veryovkin, Alex V. Zinovev

  2. Al2O3 Films • Five samples have been tested • Inconsistent results • Most likely due to reconfiguring ammeter to protect from possible overvoltage • SEY should be reexamined • Estimate completion by Thanksgiving

  3. Al2O3 Films

  4. Future Plans • Electron beam pulsing • A few more ‘bugs’ need to be worked out so that inconsistencies in Al2O3 films can be resolved • I will retest SEY on MgO samples to compare results between pulsed and continuous electron beam measurements

  5. Future Plans • Bridging Experimental and Simulated Results • Different incident angles for primary beam • Other than normal incidence, I may be able to provide one or two other angles (10 to 20 degrees from normal) • These results will not look pretty as I have to eliminate sample bias which drastically reduces yield (increased secondary recapture) • Other methods for angle dependence will take too long • SEY from layered sample (resistive layer under secondary electron emission later)

  6. Future Plans • Auger Electron Spectroscopy (AES) • XPS sampling area is much larger than electron beam ‘ageing’ area • With AES, we may be able to examine chemical composition using the same beam that ‘aged’ the sample. • AES uses up to a 3 keV electron-beam and will affect composition • Must be careful in how we interpret results

  7. Recap on Plans • What are the priorities of the group? • Film Thickness (Al2O3 and MgO) • Proper Pulsing of Electron Beam • Ageing Information • Data to help simulations • All of these require different techniques (cannot be done simultaneously) • I can do them, but need to know what priority

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