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ANL MCP #145 Phosphor Tests 1/24/2011

ANL MCP #145 Phosphor Tests 1/24/2011. Incom substrate, 33mm diameter, ANL MCP#145 20µm pores, 8° bias, 60:1 L/D, 65% OAR Chemistry 2 resistive layer, MgO SEE layer Electrode deposited on top of ALD layers Annealing conditions unknown (Anil?) 25MΩ in air with DMM.

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ANL MCP #145 Phosphor Tests 1/24/2011

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  1. ANL MCP #145 Phosphor Tests1/24/2011 • Incom substrate, 33mm diameter, ANL MCP#145 • 20µm pores, 8° bias, 60:1 L/D, 65% OAR • Chemistry 2 resistive layer, MgO SEE layer • Electrode deposited on top of ALD layers • Annealing conditions unknown (Anil?) • 25MΩ in air with DMM. • 25MΩ in vacuum initially with DMM, then drifts up to 70MΩ. • 25MΩ in vacuum at voltage (20µA at 500V) J. McPhate – LAPP Main Telecon

  2. MCP #145, Phosphor Imaging 900V 1000V Screen 3000V for all 900V J. McPhate – LAPP Main Telecon

  3. Output vs. Voltage Hard to make direct comparison to MCP #103 (Ar anneal discolored MCP), but looks to be significantly higher gain. Note use of one penray lamp on MCP #145, versus two lamps for MCP #103, yet output is about twice. J. McPhate – LAPP Main Telecon

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