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Pertemuan 5 Fabrikasi IC CMOS. Matakuliah : H0362/Very Large Scale Integrated Circuits Tahun : 2005 Versi : versi/01. Learning Outcomes. Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS. IC Fabrication.
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Pertemuan 5Fabrikasi IC CMOS Matakuliah : H0362/Very Large Scale Integrated Circuits Tahun : 2005 Versi : versi/01
Learning Outcomes Pada Akhir pertemuan ini, diharapkan mahasiswa akan dapat menyebutkan proses fabrikasiIC CMOS.
IC Fabrication Sumber: http://mems.cawru.edu/shortcourse/figure/I_2.1.gif
Diameter Silicon wafer Wafer Die sites Sumber: http://www.amd.com Silicon Processing 2
Silicon oxide O2 flow XSi SiO2 layer Xox Silicon wafer Silicon wafer SiO2 molecues Final structure Growth phase CVD oxide Substrate Material Growth & Deposition
Ion implanter Ion source accelerator Magnetic mass separator Ion beam wafer Silicon nuclei electron cloud Ion Silicon wafer x 0 IC Layers
poly substrate poly After CMP After oxide deposition substrate Glass Pattern on underside Lythography
Photoresist spray Spinning wafer Photoresist coating Resist application Vcuum chuck Coated wafer Edge bead Edge bead Flat resist Wafer Beading Lythography
UV Exposure step Reticle Projection optics (not shown) Reticle shadow Resist-coated Wafer surface Lythography
UV Reticle Resist Wafer Exposure pattern Hardened resist layer Wafer After development and rinsing Lythography
Hardened resist layer Oxide layer Substrate Initial patterning of resist Pattern oxide layer Substrate After etching process Lythography
Arsenic ions Substrate Incoming ion beam n+ n+ Substrate Doped n-type region Lythography
FOX FOX FOX FOX p-epitaxial layer n-well p+ substrate p, Na e. Field oxide growth a. Starting wafer with epitaxial layer n-well p, Na n-well b. Creation of n-well in p-epitaxial layer p, Na Nitride f. Surface preparation n-well n-well p, Na p, Na c. Active area definition using nitride / oxide d. Silicon etch CMOS Process Flow
n-well p, Na a. Gate oxide growth poly n-well p, Na Arsenic implant • Gate oxide growthPoly gate deposition • & patterning resist Boron implant n-well p, Na n+ implant resist d. nSelect mask and implant n-well p, Na c. pSelect mask and implant p+ implant CMOS Process Flow
n-well p, Na W W W W W W Ke pin IC wire a. After anneal and CVD oxide Overglass c. Metal 1 coating and patterning Bond n-well p, Na Metal bonding pad Metal 1 Bonding pad b. After CVD oxide active contact, W plugs n-well p, Na CMOS Process Flow
poly wp Sp-p poly wp Wp = minimum width of polysilicon line Sp-p = minimum poly-topoly spacing Design Rules
RESUME • IC Fabrication: Flow of process. • Silicon Processing: wafer, material growth, deposition. • Lythography: pattern, photoresist coating, exposure steps, etching, n-type. • CMOS Process flow. • Design rules