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Coherent X-ray Imaging Instrument

Coherent X-ray Imaging Instrument. S ébastien Boutet CXI Instrument Scientist June 3, 2009. Outline. CXI Science CXI Goals and Physics Requirements CXI Instrument Overview X-ray Optics and Diagnostics KB Mirror Systems Sample Environments Detector Operating Modes

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Coherent X-ray Imaging Instrument

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  1. Coherent X-ray Imaging Instrument Sébastien Boutet CXI Instrument Scientist June 3, 2009

  2. Outline • CXI Science • CXI Goals and Physics Requirements • CXI Instrument Overview • X-ray Optics and Diagnostics • KB Mirror Systems • Sample Environments • Detector • Operating Modes • Work Breakdown Structure • Early Science Instrument Scope • Preliminary Instrument Design Review • Summary

  3. Science Team • Specifications and instrument concept developed with the science team. The CXI team leaders • Janos Hajdu, Uppsala University (leader) • Henry Chapman, DESY, University of Hamburg • John Miao, UCLA

  4. Coherent Diffractive Imaging of Biomolecules One pulse, one measurement Particle injection LCLS pulse Wavefront sensor or second detector Noisy diffraction pattern Combine many measurements into 3D dataset Combined Data Set Reconstruction Data Frames

  5. Coherent X-ray Imaging Science Protein molecule injection LCLS detector detector To mass spectrometer X-ray diffraction pattern • 3D bio imaging beyond the damage limit • Single injected reproducible biomolecules that can’t be crystallized • Proteins • Membrane Proteins • Viruses • Molecular complexes • Molecular machines • Biomolecular structure determination from nanocrystals • No need for large high quality crystals • 2D bio imaging beyond the damage limit • Live hydrated cells with particle injector • Nanoparticles • Quantum dots • Amorphous nanoparticles • High fluence X-ray-matter interactions • Damage studies during the pulse • Effect of tamper layers on damage

  6. CXI Instrument Goals/Requirements • Goals • Perform imaging of single particles at highest spatial resolution achievable using single LCLS pulses • Image biological nanoparticles beyond the classical damage limit using single LCLS pulses • Global Requirements (SP-391-000-19) • Tailor and characterize X-ray beam parameters • Spatial Profile • Intensity • Repetition rate • Deliver the sample to the beam and control its environment • Key Performance Parameters • 4-20 keV energy range • Using the fundamental and third harmonic • Set by LCLS beam • Particle Injector • 50-500 nm size range

  7. CXI Instrument Location Near Experimental Hall AMO X-ray Transport Tunnel SXR XPP CXI Endstation XCS Source to Sample distance : ~ 440 m Far Experimental Hall

  8. Far Experimental Hall CXI Control Room Lab Area XCS Control Room Hutch #6 X-ray Correlation Spectroscopy Instrument Coherent X-ray Imaging Instrument

  9. CXI Instrument Overview Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  10. CXI Instrument Overview Detector Stage (upstream position) Particle injector LCLS Beam Sample Chamber Precision Instrument Stand Detector Stage (back position)

  11. X-ray Optics and Diagnostics Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  12. X-ray Optics and Diagnostics Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS • LUSI Attenuator\Pulse Picker System • Excellent Optical Quality • > 3 steps per decade of attenuation above 6 keV • > 1012 attenuation < 17 keV • Isolate 3rd harmonic from fundamental • Tailor rep rate up to 10 Hz Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  13. Reference Laser Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Rough alignment of the experiment without the X-ray beam • Requirements • On/Off states • Beam size • Smallest possible at the end of the hutch • Stability • 5% of FWHM (short term) • 15% of FWHM (long term) • Useable with any part of the instrument vented to air • Window valves • Aligned to the unfocused FEL beam to within 100 microns 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  14. CXI 1 µm KB Mirrors Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Produce a 1 µm focus • Focal lengths • 8.2 m for M1 • 7.8 m for M2 • Requirements • 350 mm clear aperture • 3.4 mrad maximum incidence angle • SiC coating • <1 nm rms height error over entire mirror • 2-11 keV energy range • Space for 2 coating strips 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  15. CXI 1 µm Sample Environment Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Position samples on grids and apertures • Maintain high vacuum • Requirements • Accommodate multiple experiments configurations • Fixed targets • Injected particles • Interface with • Detector Stage downstream and upstream • Ports for • Particle Injector • Ion TOF • Lasers • Vacuum better than 10-7 torr • Rapid access • Large volume for flexibility • Compatible only with 1 micron KB System 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  16. CXI 0.1 µm KB Mirrors/Sample Environment Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Produce a ~100 nm focus • Focal lengths • 0.9 m for M1 • 0.5 m for M2 • Requirements • Identical to 1 micron KB System in every way except for the mirror curvature • Integrated system with 0.1 micron Sample Chamber due to close proximity • Extend vacuum enclosure by ~600 mm for sample area • Separate both parts of the vacuum enclosure with valve and window 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  17. CXI Particle Injector Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Deliver support-free single particles to the LCLS beam • Requirements • < 250 microns Particle beam focus • > 50 % Transmission • 10 mm XZ Translation • 10 – 1000 nm Particle size range • Aerodynamic lens • Stack of concentric orifices with decreasing openings. • Particle beam diagnostics • Charge detectors • Particle beam viewer 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  18. CXI Ion TOF Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Detect ions produced by exploding sample • Provide a veto trigger signal when a particle was hit by the beam • Identify unwanted particles • Requirements • 1 Atomic Mass Unit resolution • Up to 100 AMU detection • 1 GHz digitization • Does not interfere with imaging detector • Design based on AMO Ion Spectrometer 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  19. CXI Detector Guard Slits Collaboration with the Gruner Group at Cornell University Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • 2D Pixel Array Detector • High resistivity Silicon (500 µm) for direct x-ray conversion. • Reverse biased for full depletion. • Bump-bonding connection to CMOS ASIC. • <1 photon readout noise • 110x110 µm2 pixels • 1520x1520 pixels • 103 dynamic range • 120 Hz readout • Tiled detector, permits variable ‘hole’ size • Detector not in CXI LUSI scope • Part of LCLS Project scope 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  20. CXI Detector Stage Guard Slits Diagnostics Photon Shutter XRT Attenuators Pulse Picker Reference Laser Guard Slits Diagnostics Guard Slits 1 µm KB Mirrors Diagnostics Guard Slits • Purpose • Center the detector hole on the direct beam • Position the detector at the appropriate distance from the interaction region • Requirements • Range along the beam : 50-2400 mm • Non-continuous • Vacuum better than 10-7 torr • Diagnostics behind the detector for alignment • Valve to isolate the detector vacuum • Short term stability • 1 micron • 10 µrad (pitch/yaw) 0.1 µm KB Mirrors 0.1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage FEH Hutch 5 Guard Slits Diagnostics 1 µm Sample Environment Particle Injector Ion TOF-MS Detector Stage Wavefront Monitor Beam Dump

  21. Operating Modes • Photon operating modes described in LCLS Document 1.6.009 • CXI operation requires SH1, SH2 and S5 open • CXI has three modes: • “1 micron” Mode • Use 1 micron KB mirrors and 1 micron Sample Environment • “0.1 micron” Mode • Use 0.1 micron KB mirrors and 0.1 micron Sample Environment • “Unfocused” Mode • No focusing optic and 1 micron Sample Environment

  22. CXI with 1 micron and Unfocused Beam Diagnostics/ Common Optics Diagnostics & Wavefront Monitor 1 micron Sample Environment 1 micron KB Reference Laser

  23. CXI with 0.1 micron Beam Diagnostics/ Common Optics Wavefront Monitor 0.1 micron KB & Sample Environment 1 micron KB Reference Laser

  24. Work Breakdown Structure

  25. Scope

  26. Preliminary Instrument Design Review • Design review held on December 4, 2007 • PIDR Committee Members • John Arthur (LCLS) • Chris Jacobsen (Stony Brook) • Stefano Marchesini (LLNL) • Michael Soltis (SLAC, SSRL) • Quotes from Report • “The committee found the preliminary design well thought out, and the proposed design viable. The design appears to be appropriately flexible and applicable to a wide range of diffraction-imaging science.” • “The committee recommends that the experimental team move forward with the design leading to a Final Design Review, taking into account the comments and recommendations enumerated below.”

  27. Preliminary Instrument Design Review (2)

  28. Preliminary Instrument Design Review (3)

  29. Preliminary Instrument Design Review (4)

  30. Preliminary Instrument Design Review (5)

  31. Summary Instrument accommodates a wide variety of cutting edge research capabilities and fulfills the CD-0 mission The CXI instrument is versatile: X-ray optics can tailor FEL parameters for users Sample environment can accommodate multiple experimental configurations User operation start planned for 2011 First call for proposals Spring 2010 CXI 2nd Scientist Position Opened CXI Website: http://lcls.slac.stanford.edu/cxi/

  32. Supporting Slides

  33. Assembly with Positioning Plate Removed • Modular design • Allows for addition of tiles in the future • Initial detector • 8 modules • Variable hole size Cross-roller rails support positioning plate and provides low-friction, repeatable motion Torque ring rotates to translate Quadrant Rafts and change aperture size Martin Nordby & Matthew Swift

  34. Front View—1 mm Aperture

  35. Front View—6 mm Aperture

  36. Front View—10 mm Aperture

  37. Back View with Base Plate Removed—1 mm Aperture

  38. Back View with Base Plate Removed—6 mm Aperture

  39. Back View with Base Plate Removed—10 mm Aperture

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