ASDBLR & DTMROC Testing Production Run Completion

1. ASDBLR & DTMROC TestingProduction Run Completion Rick Van Berg for Gabe Hare, Mike Reilly R. Van Berg, Sept. 2, 2004

2. DTMROC Tests • Analog (PMU): • IDD • DAC outputs • Sense inputs (Temp/Voltage) • Test pulse outputs • Digital: • Complete Verilog test suite from Vladimir • Analog and Digital tests have been integrated R. Van Berg, Sept. 2, 2004

3. DTMROC Status • Production Testing Completed 8/25/04 • Production Test cuts very stringent • Will want to rerun after sorting to pick up additional good chips • Expect about 30+% of “Bad” chips to pass on a second pass • Sorting Files Assembled • Sort as needed or as possible R. Van Berg, Sept. 2, 2004

4. DTMROC Status II • 36,338 Chips Tested. • 24,912 Passed • 12,731 Failed • 66% Pass Rate • Will add at least 10% with a second pass • Need to test some remaining pre-prod chips • TRT Requires about 33k (with PP etc.) • May want to package a few more wafers R. Van Berg, Sept. 2, 2004

5. DTM Loss Statistics R. Van Berg, Sept. 2, 2004

6. ASDBLR Testing Status • 139,058 ASDBLR have been tested. • Includes LHCb wafers (~20% of total) • TRT owns about 59k ”good” chips after DC and parametric cuts. • Retesting of ”bad” chips should yield some additional (small) gain • TRT Requirement (A/B/C/Barrel + ~20% spares) is 64kchips R. Van Berg, Sept. 2, 2004

7. ASDBLR Tests • Analog (PMU): • Power Supplies ICC, IEE • A/B Input Voltages & Resistances • Tracking, Transition Threshold I/V • Data Output Switching (IA, IB in On & Off States) • Parametric: • 50% Efficiency Thresholds • Tracking at: 0 fC, 3 fC, 5 fC • Transition at: 30 fC, 50 fC R. Van Berg, Sept. 2, 2004

8. Input Resistance Cuts 4,273 had at least one input outside of the input Resistance limits of 10,000 – 50,000Ohms 26 44 Nominal = 38 kOhms R. Van Berg, Sept. 2, 2004

9. Power Supply Cuts 9,480 were outside of the N power supply current limits of -0.076 - -0.064 10,744 were outside of the P power supply current limits of 0.064 - 0.076 8,881 failed BOTH P power supply and N power supply R. Van Berg, Sept. 2, 2004

10. Input Diode Cuts 9,898 had at least one input outside of the input Diode voltage limits of 0.5 - 1.05 V 0.725 0.825 R. Van Berg, Sept. 2, 2004

11. Ternary Output Drive Current R. Van Berg, Sept. 2, 2004

12. Sequential Losses Preliminary Tests 4,273 : Of All Chips Failed Input Resistance Tests10,406 : Remaining Chips Failed Power Supply Tests 519 : Remaining Chips Failed Input Diode Voltage Tests 1,300 : Remaining Chips Failed Threshold Current Tests 838 : Remaining Chips Failed Output Current Sum Tests11,760 : Remaining Chips Failed Output Switching Tests19,684 : Remaining Chips Failed Half Efficiency Point Search R. Van Berg, Sept. 2, 2004

13. Preliminary Test Co-Variances 0 : any Input Resistor and P power supply2382 : any Input Resistor and N power supply572 : any Input Resistor and BLR of power supply3115 : any Input Resistor and any Input Diode1106 : any Input Resistor and any Threshold1074 : any Input Resistor and any Output Sum1386 : any Input Resistor and any Comparator Switching3126 : any Input Resistor and any Half Efficiency Point Search8881 : P power supply and N power supply6820 : P power supply and BLR of power supply7322 : P power supply and any Input Diode7586 : P power supply and any Threshold7295 : P power supply and any Output Sum8398 : P power supply and any Comparator Switching9593 : P power supply and any Half Efficiency Point Search6893 : N power supply and BLR of power supply7220 : N power supply and any Input Diode7560 : N power supply and any Threshold7679 : N power supply and any Output Sum8493 : N power supply and any Comparator Switching9348 : N power supply and any Half Efficiency Point Search 6099 : BLR of power supply and any Input Diode6420 : BLR of power supply and any Threshold6278 : BLR of power supply and any Output Sum6876 : BLR of power supply and any Comparator Switching7162 : BLR of power supply and any Half Efficiency Point Search6799 : Any input Diode and any Threshold6517 : Any input Diode and any Output Sum7324 : Any input Diode and any Comparator Switching9549 : Any input Diode and any Half Efficiency Point Search7145 : Any Threshold and any Output Sum7849 : Any Threshold and any Comparator Switching8441 : Any Threshold and any Half Efficiency Point Search8233 : Any Output Sum and any Comparator Switching8795 : Any Output Sum and any Half Efficiency Point Search21205 : Any Comparator Switching and any Half Efficiency Point Search R. Van Berg, Sept. 2, 2004

14. Zero Injected Charge R. Van Berg, Sept. 2, 2004

15. ~ 5 fC Injected Charge R. Van Berg, Sept. 2, 2004

16. Found Half Efficiency Points R. Van Berg, Sept. 2, 2004

17. Zero Charge Deviations – Worst Channel from Average R. Van Berg, Sept. 2, 2004

18. ~5 fC Deviations R. Van Berg, Sept. 2, 2004

19. 5 fC Channel Offsets R. Van Berg, Sept. 2, 2004

20. 5 fC Matching After Prelim Cuts +0.050 V -0.140 V R. Van Berg, Sept. 2, 2004

21. ~30 fC Matching After Prelim Cuts +/- 0.050 V R. Van Berg, Sept. 2, 2004

22. ASDBLR Summary • 139,000 chips tested • About 59,000, 53 % pass all cuts • Except – No tests for shorted test capacitors (see Mitch’s talk) • Maybe a few percent more good chips remaining in “bad” group (tester errors) • Enough for A / B / C / Barrel plus 10% spare boards – NO SPARE REPLACEMENT CHIPS R. Van Berg, Sept. 2, 2004

23. S(M)ummary II • Need to understand / test / etc. shorted test capacitor effect • Need to develop bad chip replacement strategy for board repairs • Need to sort and pack up chips (still work for the Exatron and it’s friends) R. Van Berg, Sept. 2, 2004