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Introduction to IFE Materials Studies on Z and RHEPP

Introduction to IFE Materials Studies on Z and RHEPP. C. L. Olson, T. J. Tanaka, T. J. Renk, M. A. Ulrickson, G. A. Rochau, and S. T. Eakle Sandia National Laboratories, Albuquerque, NM P. Peterson University of California, Berkeley, CA R. R. Peterson and I. Golovkin

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Introduction to IFE Materials Studies on Z and RHEPP

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  1. Introduction to IFE Materials Studies on Z and RHEPP C. L. Olson, T. J. Tanaka, T. J. Renk, M. A. Ulrickson, G. A. Rochau, and S. T. Eakle Sandia National Laboratories, Albuquerque, NM P. Peterson University of California, Berkeley, CA R. R. Peterson and I. Golovkin University of Wisconsin, Madison, WI T. R. Knowles Energy Sciences Laboratories, Inc., San Diego, CA A. R. Raffray and M. S. Tillack University of California, San Diego, CA Laser IFE Meeting Pleasanton, CA November 13-14, 2001

  2. IFE Chamber Materials Response ProgramCollaboration Initiated May 2001 SNL Plan & coordinate Z (x-ray) and RHEPP (ion) experiments Field experiments, plan & coordinate diagnostics Analyze and summarize experimental data U. Wisconsin Pre-shot BUCKY runs for Al, Flibe, Pb/Li, Graphite Participate in experiments, analyze data (e.g., VISAR, SEM) Post-shot BUCKY calculations for above materials UCB Design/fabricate sample holders for Flibe and debris collection Analyze and summarize experimental data Compare with TSUNAMI Code predictions UCSD Perform analysis of x-ray deposition & heat transfer in fibers Design, fabricate, and mount samples Analyze and summarize experimental data ESLI Design and fabricate carbon fiber test pieces Assist in analysis of exposed samples

  3. Regimes of IFE Materials Response Studies for IONS Ablation Depth (mm) Net Ablation No net ablation, but surface roughening F(J/cm2) Threshold for ablation Goal: find single shot threshold find effect of up to 1000 shots

  4. Regimes of IFE Materials Response Studies for X-RAYS Ablation Depth (mm) Net Ablation No net ablation, but surface pitting F(J/cm2) Threshold for ablation Goal: find single-shot threshold for ablation Issues: (1) avoiding debris on Z (apertures/collimator/fast EM shutter) (2) accurate determination of actual fluence & spectra

  5. Threshold Fluence for Ablation Depends on Ion Range (for ions) or Absorption Length (for x-rays) Fthreshold(J/cm2) = [C(Tf – Tw) + Q](g/cm3)R(cm) Lower Limit Ions: R = range for stopping X-rays: R = absorption length [ = mass absorption coefficient]

  6. Material Fluence Application Graphite (Poco) 7 J/cm2 Dry wall Tungsten ~ 7 J/cm2 Dry wall LiF 42 J/cm2 Wetted wall surrogate Carbon velvet ~ 42 J/cm2 Dry wall Silicon Carbide Dry wall Carbon Composite Dry Wall Silicon wafer Reference material Aluminum Reference material FLiBe Wetted wall Proposed and tested samples on Z    

  7. Material Fluence Application Graphite (Poco) 0.25-8 J/cm2 Dry wall Tungsten 1-8 J/cm2 Dry wall Tantalum 1-8 J/cm2 Dry wall Carbon velvet 1-8 J/cm2 Dry wall Silicon Carbide Dry wall Carbon Composite Dry Wall Aluminum Reference material Proposed and tested samples for RHEPP    

  8. IFE Materials Studies on Z (x-ray) T. Tanaka (SNL) IFE Materials Studies on RHEPP (ions) T. Renk (SNL) Modeling of Z-Ablation I. Golovkin (U. Wisc.) Next Talks

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