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System-On-a-Chip: A case study based on the ELIET Chip. Contents. ELIET Architecture SoC trade-offs Design methodology Specification Problem General information about ELIET Designed to last System Integration Verification Conclusion References. ELIET Architecture.
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Contents • ELIET Architecture • SoC trade-offs • Design methodology • Specification Problem • General information about ELIET • Designed to last • System Integration • Verification • Conclusion • References
ELIET Architecture • ELIET stands for Electronic ISDN Echo Canceller Transceiver • Mixed analog/digital chip integrating all the functions required to implement an LT (line termination) system • ELIET building blocks are: • custom DSP • 8 bit harvard micro-controller • embedded memories (ROMs and SRAMs) • different internal and external bus protocols • A/D and D/A converters • PLL • ...
SoC trade-offs ADVANTAGES: • Cost reduction • Shortening time to market • attack productivity bottlenecks (verification) • good design methodology • Increase of complexity • Design methodology and the right verification strategy become critical DISADVANTAGES:
Design Methodology • State of the art tools • robust and proven design flow • rigorous project management • definition phase • guidelines • checklists • design specification • design phase • VHDL coding, DFT, synthesis, floorplan, wireload model generation, P&R • verification phase • behavioural models, RTL simulation, code coverage, GL simulation, formal verification • documentation phase • functional doc. • implementaion doc. • verification doc.
The Specification Problem • specification detailed enough to allow RTL coding • save time and unpleasant surprises on silicon • serve as feasability study • functionality, timing, performance, interfaces, physical issues (area, power, …) • continuously updated • paper specification • formal specification • executable specification (C, C++, matlab, Cossap, …)
The Specification Problem • Overview • Functional requirements • Physical requirements • Verification requirements • Design guidelines • Block diagram • Interfaces • signal names and meanings • transaction protocols (timing diagram) • timing specifications • set-up and hold time on inputs • clock to Q time for outputs • special signals (test, analog, …) • asynchronous signals • clocks, resets, interrupts and their timing • legal values for input and output datas • checklists (paper, scripts, …)
Designed to last • Chip design constrained by what can be verified, rather than by the functions • design style driven by verification (clock synchronous synthesizable RTL) • As the complexity of the chip increases “Pray to God approach” is not an option • No magic rule to getting first-time-right silicon • maximum level of quality in each step of the development process • no separation between front end and back end • too many macros with the wrong aspect ratio can make the chip unroutable or too big or can create unacceptable delays on critical nets • accurate wire load models for DSM • bottom up synthesis approach recommended
Designed to last • clock distribution accurately studied • balanced clock tree with low skews • test strategy decided at an early stage of the design • BIST for memories • full scan flops • max 1000 flops per scan chain • boundary scan • insulation and ad hoc testing for analog macros • Guidelines and Checklists • RTL coding guidelines • coding for portability (ieee standard types, too many subtypes, …) • guidelines for clock and reset • coding for synthesis • check code quality (profiling tools, synthesis results, ...) • no unexplained warning
System Integration • Reduce the number of new gates introduced • Massive reuse of existing proven designs • reused parts need to be pre-verified with high degree of quality to allow SOC verification to complete within a reasonable time frame • not all core configurations have been tested together • Focus of system level simulation is on errors at macro interconnections level • misunderstanding of the bus protocols • different bridges to communicate between the different busses • standardize on a single common bus architecture
Verification • Main bottleneck of the development process • Right verification strategy at each step of the design • It is verification that drives the selection of tools and design style • Define the verification plan as soon as possible • a list of all test bench components • a list of required verification tools • a list of specific tests • what functionality will be verified • target code coverage • description of the regression test environment and regression procedures • Test bench design takes more time than the circuit design • The entire set of test benches and test suites must be reusable (different design teams) and portable (different simulators)
Verification • Test bench must be one of the deliverables • Bus functional models & bus monitors • single test bench command file • VHDL test bench guidelines • use a clock to synchronize stimuli generation • use built in textio packages • partition the test bench code in synthesizable and behavioural • do not generate data , clocks and resets from the same process • common strategy for the test bench for both sub-modules and top level • the test bench has to be self-checking (no waveform inspection required) and issue a clear error message in case of failure (what occured, at what time, what was the expectation, what is the result, …)
Verification • Toggle coverage greater than 98% • Timing analysis • static timing analysis and formal verification • gate level simulation in case of asynchronous parts
Conclusion • Mixed analog/digital 4 channel ASIC for ISDN • 0.35 mm, 3.3 V technology • 4 analog macros (about 2 mm2 each) • 2 PLLs (about 1.10 mm2 ) • microprogrammed 8 bit Harvard processor for the ISDN data processing control (about 6.09 mm2 ) • custom DSP implementing the echo cancellation algorithm (about 3.07 mm2 ) • line controller (about 1.60 mm2 ) • universal external interface and iom/PCM interface (about 1.60 mm2 ) • 6 ROMs for the microprogrammed processor (about 1.76 mm2 ) • 1 ROM and 4 SRAMs for the DSP (about 1.75 mm2 ) • Total Area of the chip ~ 51 mm2
References M.Keating, P. BricaudReuse methodology manual for system-on-a-chip DesignsKluwer Academic Publishers, 1998 A.M. Rincon, W.R. Lee, M. SlatteryThe Changing Landscape of System-on-a-Chip DesignCustom Integrated Circuits Conference, 1999 R.D. AdamsSystem on a chip TestingCustom Integrated Circuits Conference Educational Sessions, 1999 D.D. WarmkeFour white papers on VHDL designIntegrated System Design, 1993