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Philippe ROUGER Sébastien MAES

Philippe ROUGER Sébastien MAES. ELECTRONIC TESTS RESULTS & CONFORMANCE TO ICD. IRAP. 12/02/2011 MAVEN-SWEA PSR. CONTENTS. SWEA: Generalities Tests results & conformance to ICD A) Control voltage & HK Values stability B) Dynamic tests

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Philippe ROUGER Sébastien MAES

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  1. Philippe ROUGER Sébastien MAES ELECTRONIC TESTS RESULTS&CONFORMANCE TO ICD IRAP 12/02/2011 MAVEN-SWEA PSR

  2. SWEA PSR IRAP CONTENTS • SWEA: Generalities • Tests results & conformance to ICD A) Control voltage & HK Values stability B) Dynamic tests C) Notes III. PART STRESS ANALYSIS

  3. SWEA PSR IRAP I. SWEA POTENTIALS Entrance grids HV_AN HV_MCP HV_DEF_UP V0 HV_DEF_DOWN GND Analyzer Deflectors MCPs

  4. SWEA PSR IRAP I. SWEA POTENTIALS 16 anods Angular Azimut resolution: 22,5° Charge Amplifiers

  5. SWEA PSR IRAP I. Electronic Boards

  6. SWEA PSR IRAP I. Electronic Boards • 3 Boards: • HVPS_Board • High Voltage generation (2,2 kV) • 1.8kV for deflectors & 750V analyzer • 3,5 kV for MCPs • Voltage Scanning functions • HV COUPLING • Interface between high/low voltage functions • Collecting Anodes & Mechanical support for MCPs • Amplifier Board • Charge amplifiers (A111F)

  7. SWEA PSR IRAP I. HVPS BOARD : Principle + + + + -12V +12V +28V HV_Analyzer 750V HV ANALYSER Cmd_Analyzer HK_Analyzer HV_Deflectors 1800V HV DEFLECTORS Cmd_Deflectors HK_Deflectors Cmd_V0 V0 Supply V0 (-25V) HK_V0 HV MCPs Cmd_MCP HV_MCP 3500V HK_MCP HVPS BOARD HK HV

  8. SWEA PSR IRAP I. HVPS BOARD : Principle HV Transformer Deflector up Deflector Down Analyzer a) Deflectors & Analyzer voltages 1.8kV 2,2kV optocouplers Oscillator Voltage Multiplier Frequency: 100 kHZ Commands 750V

  9. SWEA PSR IRAP I. HVPS BOARD : Principle HV 3.5 kV Transformer MCPs Oscillator Voltage Multiplier Feedback HK MCP Cmd MCP b) MCPs voltage Frequency: 100 kHZ

  10. SWEA PSR IRAP II. Test Conditions • The thermal tests were performed at the following temperatures : -40°C, -10 °C, +20°C, +40°C, +60°C using a thermal chamber BIA TH6-25 in ISO8 clean room facility. • For planetary protection reasons, the thermal chamber was cleaned with sterile alcohol and heated at 150°C during 6 hours.

  11. SWEA PSR IRAP II. SWEA Electrical Consumption

  12. SWEA PSR IRAP II. A) CONTROL VOLTAGES Nominal Gain HV output (V) T1 Extrem curves on T°range Worst unstability (on T° range) T2 ICD Stability (%) Offset ICD Stability (V) CMD (V)

  13. SWEA PSR IRAP II. A) CONTROL VOLTAGES: tests results

  14. SWEA PSR IRAP II. A) CONTROL VOLTAGE: OFFSETS

  15. SWEA PSR IRAP II. A) HK Values : test results

  16. SWEA PSR IRAP II. B) HV DEF1,DEF2,ANAL dynamic response Overshoot HV max 95% Requirements : Settling time < 500 µs Overshoot < 1 % 0V rise time settling time

  17. SWEA PSR IRAP II. B) HV DEF1,DEF2,ANAL dynamic response

  18. SWEA PSR IRAP II. B) HV DEF1,DEF2,ANAL dynamic response (1) Overshoot not included because lower than 1% of HV max

  19. SWEA PSR IRAP II. B) HV DEF1,DEF2,ANAL dynamic response NOTES  The dynamic responses of the HV were tested in the worst case conditions (0V to max HV)  small steps  linear ramp Sweep Waveforms The dynamic of the HV depends on the dynamic of the command signal which might be different on the SWEA digital board

  20. SWEA PSR IRAP II. C) NOTES • Temperature range of HVPS thermal tests is - 40°C to + 60°C which is wider than the expected temperature. • The tests results depend on the test conditions so some values (offsets, dynamic response) might be slightely different when the sensor will be connected to the digital board. • The main problem concerns low energy measurements because of the effect of offsets on low HV values. A calibration might be performed at SSL with digital board connected.

  21. SWEA PSR IRAP III. Part Stress Analysis Summary

  22. SWEA PSR IRAP III. Part Stress Analysis Summary

  23. SWEA PSR IRAP III. Part Stress Analysis Summary

  24. SWEA PSR IRAP III. Part Stress Analysis Summary NOTES

  25. SWEA PSR IRAP THANKS FOR YOUR ATTENTION

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