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Resonance. Paul Tobin DIT. Series-tuned circuit. The Q- factor is a measure of SELECTIVITY. The - 3dB bandwidth, resonant frequency and Q- factor. The frequency response may be used to show the relationship between Q, f o and BW. Parallel tuned circuit. Parallel tuned circuit.
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Resonance Paul Tobin DIT Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Series-tuned circuit Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Copyrigh Paul Tobin, School of Electronics and Communications Engineering
The Q-factor is a measure of SELECTIVITY. Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Copyrigh Paul Tobin, School of Electronics and Communications Engineering
The - 3dB bandwidth, resonant frequency and Q-factor Copyrigh Paul Tobin, School of Electronics and Communications Engineering
The frequency response may be used to show the relationship between Q, fo and BW Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Parallel tuned circuit Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Parallel tuned circuit Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Equivalent parallel form Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Rp is the dynamic impedance of the tuned circuit If the Q-factor is 10 or greater then Copyrigh Paul Tobin, School of Electronics and Communications Engineering
Any extra resistance placed in parallel will reduce the Q-factor of the parallel tuned circuit and is hence called the loaded Q-factor. The equivalent parallel resistance of the tuned circuit Rd, is the dynamic impedance at fo. The Loaded Q-factor Any resistance, when added to a resonant circuit, will change the characteristics of that circuit Copyrigh Paul Tobin, School of Electronics and Communications Engineering
R is the total loading The Loaded Q-factor Copyrigh Paul Tobin, School of Electronics and Communications Engineering
The impedance of a tuned circuit Copyrigh Paul Tobin, School of Electronics and Communications Engineering