1 / 3

LTD12 Paris, July 2007

LTD12 Paris, July 2007. Cryogenic X-ray detectors: state of the art. TES. Si-thermistor: 3.2eV. ~ 100ms @ optimal ETF. g -rays: 25eV @ 103keV (Mo/Cu TES array from NIST). Type I SCs (low k ) are suitable for X-rays; type II for optical).

duncan-white
Download Presentation

LTD12 Paris, July 2007

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. LTD12 Paris, July 2007 • Cryogenic X-ray detectors: state of the art • TES Si-thermistor: 3.2eV • ~ 100ms @ optimal ETF g-rays: 25eV @ 103keV (Mo/Cu TES array from NIST) Type I SCs (low k) are suitable for X-rays; type II for optical) • STJ more suited for <2keV and for position sensitive devices • Magnetic microcalorimeters 2.7eV @ 6keV; 35mK, t ~ 8ms • (fast improvements, catching up TES) • KIDs (JPL and Caltech) t limited by qp lifetime: t ~ 30ms

  2. Mo/Au bilayers: Tc versus deposition and stress Deposition of Mo thin films: e-beam: tensile, decreases for increasing Ts; SC for Ts ~ 600ºC Tc<800mK sputtering: stress tuned by deposition conditions; chosen compressive RT sputtered films show better stability and reproducibility Deposition of Au thin films: strong change of RRR: e-beam: higher RRR, ~ 6 sputtering: too low RRR (would force too thick films) (Chervenak et al., GSFC)

  3. TES and noise • Discrepancies between results of SRON (Ti/Au) and NIST (Mo/Cu), regarding unexplained noise and relationship to a and geometry. • SRON: low C TES (low R) display better resolution • Finland: a Ti/Au TES in Corbino geometry: higher noise, reduced for increasing a

More Related