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Some Limits of Power Delivery in the Multicore Era. Runjie Zhang , Brett H. Meyer, Wei Huang, Kevin Skadron and Mircea R. Stan University of Virginia, McGill University, IBM Austin Research Lab. ITRS Projection on Transistor Density (2011 Edition). Source: ITRS 2011.
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Some Limits of Power Delivery in the Multicore Era Runjie Zhang, Brett H. Meyer, Wei Huang, Kevin Skadron and Mircea R. Stan University of Virginia, McGill University, IBM Austin Research Lab.
ITRS Projection on Transistor Density (2011 Edition) Source: ITRS 2011
Power Density and Current Density A/mm2 Current = Power / Supply Voltage
The Chip - Package Source: pcgameshardware.com
The Chip – Inside the Package Source: ITRS 2009Edition,
The Chip – C4 Bumps Source: Wikipedia Source: flipchips.com,
What are the problems? Electromigration Total Pad Count Source: Ye et al. Applied Physics letters, 2003 Year Source: Shaoet al. IEEE Computer Society Annual Symposium on VLSI, 2005 Source: ITRS 2011Edition,
Architecture Level PDN Model • Input: • PDN physical parameters. E.g. metal width • Processor floorplan and powermap. • Pad configuration • Output: • Voltage pad • Pad current
Validation • IBM Power Grid analysis benchmarks • Steady-State • SPICE format • Provides details about metal layer and Pad locations
IBM_PG6 Power Map VDD Pad Distribution
Multicore Scaling Baseline: 3.7GHz, Duo Core, Intel Penryn 4-way OoO Processor Private L2 cache, 3MB per core Mesh-Based NoC
Sorted Pad Current Before Optimization Sorted Pad Current After Optimization
I/O vs. Power Supply Const core-to-MC ratio 80 pads per MC 5% IR drop target
Conclusions • Power delivery is becoming a limiting factor in near future; • IR drop poses a bigger challenge than ElectroMigration; • Memory bandwidth will be affected’ • With liquid cooling, scaling hit power delivery wall before thermal wall.
Temerature Map vs. Voltage Map Temperature(oC) Voltage (V)
Voltage (V) Temperature(oC)