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Weir PW. ASML XT14xx – ASML_OV_EX1. Dataset: Overlay & Registration Data Features: . TEA Systems Corp. 65 Schlossburg St. Alburtis, PA 18011 610 682 4146 TZavecz@TEAsystems.com May 25,2007. Project Summary. Program : Weir PW Situation:
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Weir PW ASML XT14xx – ASML_OV_EX1 Dataset: Overlay & Registration Data Features: TEA Systems Corp. 65 Schlossburg St. Alburtis, PA 18011 610 682 4146 TZavecz@TEAsystems.com May 25,2007
Project Summary • Program: Weir PW • Situation: • Import of AMAT NanoSEM 3D with multi-feature types. Vector Raptor import of ASML data
ASML_OV_EX1_family Analysis of data by wafer
Overall Data for 3 wafers Vector Raptor import of ASML data
Wafer model • Wafer modeled values • This is a “Process Model” since we look for vector change as a function of position on the wafer rather than it’s grid location. Vector Raptor import of ASML data
Wafer Response • “WaferResponse_Vector” workbook sheet showing residual & systematic variation Vector Raptor import of ASML data
Modeled values for each wafer • WaferModel_Vector worksheet Vector Raptor import of ASML data
Residuals to the wafer model Vector Raptor import of ASML data
Wafer & Field Fitted response • Only first 5 terms of field model used • Validation is turned on • Model is fitted to each column of data • So no trap values Vector Raptor import of ASML data
Field Response only • Fitted wafer contribution is not shown here • (above) X-offset by column location for 3 wafers Vector Raptor import of ASML data
Offset +/- Std Error • Graph generated for each “family” • In this case for each wafer Vector Raptor import of ASML data
Range of Field Fitted Response Vector Raptor import of ASML data
ASML XT1400 Family Data • Overlay and Matching data • Note: • Data headings have been changed from the dz-H, dz-V names to the correct Xreg & Yreg nams • Please ignore and dz-h,v names on these graphs Vector Raptor import of ASML data
Imported overlay • XY Overlay Data • Image Data is summarized on a data sheet • Four (4) data sheets are imported • Overlay Data • Excluded Data points • Registration #1 and • Registration #2 data Vector Raptor import of ASML data
Excluded Data • 25 Data points were excluded • All were on the last field of wafer #3 Vector Raptor import of ASML data
Registration & Overlay Data Registration 1 Registration 2 • Overlay = Reg2 – Reg1 Overlay Vector Raptor import of ASML data
Raw Overlay Wafer #1 Yoverlay Xoverlay Vector Raptor import of ASML data
Wafer #2 raw overlay Xoverlay Yoverlay Vector Raptor import of ASML data
Precision Calculation • Precision of the Raw X,Y overlay data • X & Y registration have an average 2 nm precision (one sigma) • Most of the variation comes from InterField or Field-to-Field variation • i.e. “Stage-stepping precision” • Variation within a field is (0,3, 1.6) nm one sigma • Wafer to wafer variation is (0.3, 0.6) nm Vector Raptor import of ASML data
Covariance Vector Raptor import of ASML data
ASML Wafer Model Vector Raptor import of ASML data
Column-base modeled overlay First 5 terms of the ASML model will be applied to each individual column of each field.
Column model, offset only Vector Raptor import of ASML data
Field-Column Model Response • FieldResponse_Column Vector Raptor import of ASML data
Column Model Summary • Sheet Vector Raptor import of ASML data
Modeled column offset Vector Raptor import of ASML data
Column offset values • Field is next Collapsed into the vector results for a single field Vector Raptor import of ASML data
Offset by column position Vector Raptor import of ASML data
Xreg Column offset by wafer • This is X overlay data • The “dz-H” value shown here is wrong but the data is right • This has been changed Wafer 1 Wafer 2 Wafer 3 Vector Raptor import of ASML data
ASML Row Model Applied Vector Raptor import of ASML data
Row Model Summary • Data sheet: “FieldModel_Row_Summary_Xyvec” • Only offset values shown • Summary of each model fit by row location on field Vector Raptor import of ASML data
Row-model response • FieldResponse_Row_Xyvec Vector Raptor import of ASML data
Row Magnification Change Vector Raptor import of ASML data
Overall Response of Raw Data Vector Raptor import of ASML data
Overall Model Response Vector Raptor import of ASML data
Wafer (process) based response • Vectors are modeled by their location on the wafer • Does not use “grid” stepping location of scanner • Process-induced response of overlay or • Overall effect of wafer mag/rotation error. Vector Raptor import of ASML data
Full-Field, selected components • Wafer & Field were modeled • Only the offset, mag & rotation were displayed • Fitted data is only for these 3 coefficients Vector Raptor import of ASML data