專題 報告

1. 專題報告 指導教授 曾王道 961428 陳映蓉 961556 賴亭文

2. The compitition • 教育部主辦「九十八學年度大學校院積體電路電腦輔助設計(CAD)軟體製作競賽」 • 題目：定題組　Ａ２組 • 題目內容：Multi-Core ATPG

3. ATPG • acronym for both Automatic Test Pattern Generation and Automatic Test Pattern Generator • electronic design automation method/technology • To find faulty circuit behaviors.

4. Parallel ATPG • As the size and complexity of ICs continue to grow, ATPG time is getting longer. • multi‐core processors to make Parallel ATPG

5. ATPG V.S.Parallel ATPG

6. Goal • develop an ATPG program • fast run time • few generated patterns • high fault coverage • under the given multi‐core computing environment.

7. Fault collapsing

8. Fault collapsing

9. Example

11. The results of the example • PI G0 PI G1 PI G2 PI G3 PI G5 PI G6 PI G7 • 0 1 1 0 0 1 0 • 1 0 0 1 0 0 1 • 1 0 1 1 0 0 0 • 1 1 1 1 0 0 0 • 0 0 1 0 1 1 1 • 0 0 1 1 1 0 0 • 1 0 0 1 1 0 0 • 0 1 1 0 0 0 0 • 1 0 0 0 0 1 0

12. Our Inplementation • We use fork() to create a new process to implement the multicore ATPG. • fork() • The fork() function shall create a new process. • then we have a child process, and a parent process. The two process would run by the same time to implement the multicoreATPG.

13. 執行結果

14. The end