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Wire Widening

Bjoern Konieczek. Wire Widening. Problem – Electromigration. Possible Solution – Wire Widening. Current density is obtained as ratio of current and cross-section area Most process technologies assume constant thickness of printed interconnects

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Wire Widening

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  1. BjoernKonieczek Wire Widening

  2. Problem – Electromigration

  3. Possible Solution – Wire Widening • Current density is obtained as ratio of current and cross-section area • Most process technologies assume constant thickness of printed interconnects • Wire width exerts direct influence on current density

  4. Influence on the Design • Electromigration mostly effects supply lines

  5. Conclusion • Wire widening  more robust wires in terms of electromigration • Increases impact of negative effects on the wires • Designer has to take care of this higher impact of negative effects

  6. Thank YOU For YOUR ATTENTION

  7. Sources • Anurag Seth, „Electromigration in Integrated Circuits – Workshopon Reliability and Physical Verification”, IIT Delhi, 12 Dec 2009 • Prof. Dr. Ing. Dirk Timmermann, Unpublished Handout of Lecture„HochintegrierteSysteme I“, University of Rostock, 2009 • The International Technology Roadmap for Semiconductors, 2005

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