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Acquisition of Ultrafast Spectroscopy Instrumentation for Materials Research and Education James L. Merz, University of Notre Dame, DMR 0619725.
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Acquisition of Ultrafast Spectroscopy Instrumentation for Materials Research and Education James L. Merz, University of Notre Dame, DMR 0619725 • Ultrafast temporal spectroscopy (UTS) ofnanostructured materials was combined with near-field scanning optical microscopy (NSOM) having spatial resolution 50 nm (see Fig1). • A number of significant results were realized with this novel system: • - Effect of residual chemicals on recombination dynamics of single of colloidal CdSe nanowires was revealed for the first time. • - Recombination dynamics of single CdTe/ZnTe/GaSb quantum dots was measured for the first time, allowing probing their size dispersion. • - Wigner localization was demonstrated in emission spectra of single self-organized InP/GaInP quantum dots. • - Purcell effectwas measured for whispering-gallery modes GaInP micro-discs with embedded InP quantum dots T=2-300 K UTS-NSOM setup
Acqusition of Ultrafast Spectroscopy Instrumentation for Materials Research and Education James L. Merz, University of Notre Dame, DMR 0619725 The UTS-NSOM system developed in the Nano-optics lab at the University of Notre Dame was used for collaborative research with other ND faculty to study effects of oxidation on GaAs/AlGaAs lasers (D. Hall, EE), emission properties of colloidal CdSe nanowires (M. Kuno, Chemistry and Biochemistry), CdSe/ZnTe quantum dots (J. Furdyna, Physics) and with a number of international collaborators to study recombination dynamics of InGaN blue-green quantum wells (V. Sizov, Ioffe Institute, Russia), carrier diffusion in GaInP solar cell epi-layers (S. Mintairov, Ioffe Institute, Russia) and decay of whispery gallery modes in InP/GaInP micro-disc lasers (K. Lemr, Palacky University, Czech Republic). UTS-NSOM system and its users: Karel Lemr (visiting student from Palacky University, Czech Republic), Alexander Mintairov (Research Professor) and graduate students from Electrical Engineering department: Yan He, Chris Seibert and Joseph Herzog