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Instrumentation for the new H - S ource T est B ench

Instrumentation for the new H - S ource T est B ench. Linac-4 Ion Source Review 2011 Uli Raich CERN BE/BI. Parameters to be measured. Beam intensity Transverse Profile Transverse Emittance Energy Spread. Instrumentation at current test bench. Faraday Cup SEMGrid Transformer

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Instrumentation for the new H - S ource T est B ench

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  1. Instrumentation forthenewH-Source Test Bench Linac-4 Ion Source Review 2011 Uli Raich CERN BE/BI Uli Raich CERN BE/BI

  2. Parameters tobemeasured • Beam intensity • Transverse Profile • Transverse Emittance • EnergySpread Uli Raich CERN BE/BI

  3. Instrumentation atcurrenttestbench Faraday Cup SEMGrid Transformer EmittanceMeter Uli Raich CERN BE/BI

  4. Installed Instruments • Faraday Cup • Measuresintensity • Usedas beam stopper • Readoutonlywithoscilloscope • SEMGridwith 20 wires • 1mm wiredistance in thecenter • Beam transformer • Sampledat 10 MHz • Emittancemeter + Faraday Cup Uli Raich CERN BE/BI

  5. Faraday Cup • Source intensity measured by a retractable Faraday Cup • Secondary electron emission are suppressed by polarization voltage which also eliminates parasitic electrons created in the source • Pneumatic in/out mechanism on PLC like LEIR is available and controlled by a knob • Oscilloscope is used for signal observation • For final operation a 1 MHz sampling ADC is foreseen Uli Raich CERN BE/BI

  6. EnergySpread • On thecurrenttest stand weused a spectrometermagnet + SEMGrid • The spectrometer will beusedfor a short time in the L4 tunneland will befreeafterwards • Forthenewtest stand a 45 kVfloating FC isunderdiscussion • Needs new design • Electronics andprogramto do energyscan Uli Raich CERN BE/BI

  7. SEMGrids for Profile Meas. • SEMGrid resolution: up to 0.5mm, up to 36 wires • New analogue electronics for 36 under design • Needs time resolved measurements (200 kHz) • New VME readout card has been developed (36 channels), series of 50 cards have been produced • In/out mechanism by motor with PLC control Uli Raich CERN BE/BI

  8. Transverse Emittance Measurement • Slit and grid phase space scanner • L-shaped 0.1mm slit moves under • 45 degrees • Slit and grids move independently • Positioning precision: 50 µm • Movement PLC controlled • Slit and grids mounted in 2 independent vacuum boxes whichcan be separated • Horizontal and vertical SEMGrid • wire distance .75 mm • 30 signal wires • readout with home built 36 channel 250 kHz ADC • time resolved profiles Uli Raich CERN BE/BI

  9. EmittanceMeter Readout Uli Raich CERN BE/BI

  10. Emittance Evaluation Uli Raich CERN BE/BI

  11. Pseudo Scubexxexvaluation Histogram of signal levels Background for each slit Position Emittance Plot Emittance when taking less and less channels around peak Uli Raich CERN BE/BI

  12. ModificationstotheEmittance Meter • Long arm for the combined hor/ver slit poses mechanical problems • Use shorter separate slits or install stiff guiding • Program was designed for commissioning only • LabView for readout, write raw data onto big files • Evaluation program in C++ / Qt / Root • Either these programs must be adapted and maintained or replaced by standard CO Java application(problem of frequent adaptations) Uli Raich CERN BE/BI

  13. Current Transformers Good magnetic shielding avoids interference from nearby pulsing quads Shielding simulation and test measurements have been done New electronicsandsoftwarehasbeendevelopedfor L4Needs no additional work Uli Raich CERN BE/BI

  14. Instruments fornewtest stand • SEMGrid • Same mechanismascurrentdevice • Wirescanbepolarized in additiontopolarisationwires • New analogueelectronics (foreseenfor Linac-4) • Faraday Cup • Possibilitytopolarizeupto46 kV (variable) tomeasureenergyspread • Alternative: spectrometerwhich will not beusedfor Linac-4 anymore • Chinese copyof LEBT transformer Uli Raich CERN BE/BI

  15. Instruments fornewteststand (2) • New emittancemeter • Mechanicalchangesforeseen (2 independantslits?) • Software was designedforcommissioningonlyeitherneedstobemaintainedorreplacedbystandard CO Java application (4-5 monthsofwork) • Diagnosticsofelectronsfromsourcetobespecifiedand not counted • Instruments will beneeded ~ 4 monthsbeforeusageforassemblyandtest. Uli Raich CERN BE/BI

  16. Costtable Uli Raich CERN BE/BI

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