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Park FX40 takes care of everything automatically: from tip pick up to landing to full autonomous scanning of the sample at a click of a button. It does this by infusing robotics, AI and machine learning into its groundbreaking FX system..https://www.gaiascience.com.sg/productdetails/park-fx40--atomic-force-microscope
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Park FX40 A New Class of Atomic Force Microscope (AFM) One Nanostep for Microscopy One Giant Leap for Science The first dual-camera system ever adopted in research AFM Machine learning automation with updatable data Automatic Probe Pairing to Sample Locations Sample Camera with storage capacity for up to four different samples simultaneously on the chuck, the sample camera effortlessly locates the most relevant spot for scanning AI Robotics Technology With the simple click of a button, Park FX40 automatically changes and replaces its own tips Auto Probe Exchange: Replace old probes easily and safely in full automation. Auto Probe Reading: The Probe Identification Camera reads the QR code imprinted on the chip carrier of a newly loaded probe enables you to select the best probe tip for each job. Auto Beam Alignment: It shifts the X, Y and Z axis for clearer images, with no distortion, at the click of a button. Contact us for more details! Authorized Distributor: Gaia Science Pte Ltd +65 6897 2772 www.gaiascience.com.sg enquiry@gaiascience.com.sg Block 102 E Pasir Panjang Road #02-07 Singapore 118529