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U of M Materials Science Seagate Design Group. Alan Bagwell Tony Lindert Loc Nguyen Greg Rayner. Industrial Mentor: Dr. Vince Engelkes. Faculty Advisor: Prof. C. Daniel Frisbie. Outline. Project Goal Project Solution: CMP Overview Detailed Solution Other Considerations Summary.
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U of M Materials Science Seagate Design Group Alan Bagwell Tony Lindert Loc Nguyen Greg Rayner Industrial Mentor: Dr. Vince Engelkes Faculty Advisor: Prof. C. Daniel Frisbie
Outline • Project Goal • Project Solution: CMP Overview • Detailed Solution • Other Considerations • Summary
Project Goal and Solution Main Goal: Reduce transducer RMS roughness from 10 Å to 2 Å Project Solution: Chemical Mechanical Processing / Nanogrinding
Chemical Mechanical Planarization Overview • Culmination of several smoothing processes • Key components: • CMP Pad • Slurry • Process control: speed, pressure, etc. http://www.icknowledge.com/misc_technology/CMP.pdf
Rough Lapping • Goal: Bulk removal • Multi-step process • Free Abrasive • Single crystal diamond (0.25+ micron particle size) • Zinc lapping plate • High speed and pressure for maximum removal rate • High speed leads to a reduction in planarization. Further lapping is required.
Fine LappingFixed versus Free Abrasive Ultraprecision Polishing GMR Harddisk Magnetic Head, Zhong, 2006
Nanogrinding • Plate Preparation • Tin-bismuth alloy (42% Sn, 58% Bi, 1.5-2 Mohs) • Surface roughness • Spiral groove • Plate is “charged” by embedding diamonds
Plate Charging • 50nm polycrystalline diamond spherical particles • 6-hour+ charging times result in better planarity Ultra precision Polishing GMR Hard-disk Magnetic Head, Zhong, 2006
Slurry Composition • Ethylene glycol with 6% silica colloid (30% SiO2, 10 nm) to increase plate life and removal rate • Chelating agent (Methionine) to dissolve metal ions • Corrosion inhibitors: BTA, Standapol, or Triton • Polyoxyethylene ether as a surfactant to increase wetting
Slurry pH • Slider consists of softer metals and harder AlTiC ceramic • Picking the correct pH will increase the solubility of the ceramic and soften it • This will allow both materials to abrade at similar rates • At pH 11, copper in the GMR stack will corrode
Slurry pH (10) On the advanced lapping process in the precision finishing of thin-film magnetic recording heads for rigid disc drives, Jiang, 2003
Other Considerations • Plate Speed: 25 rpm • Nominal Pressure: 112 kPa • Slurry Flow: 1 mL every 30 seconds • Viscosity: 2.5 cP • The viscosity can be increased by partially replacingethylene glycol with diethylene glycol
Summary • Fixed Abrasive Lapping • 50 nm polycrystalline spherical diamond particles embedded in tin-bismuth grooved plate • Plate charging time of 8 hours • Slurry Composition • Ethylene glycol with 6% colloidal silica (30% SiO2, 10 nm) • Standapol corrosion inhibitor • Polyoxyethylene ether surfactant • Diethylene glycol to raise viscosity to 2.5 cP • Chelating agent (Methionine) to dissolve metal ions • Organic pH regulators such as NH4OH to achieve a pH of 10