270 likes | 403 Views
IIV and CV Measurements of rd50-(2551-6, 2551-4, 2552-7) Sadia Khalil VELO Group Meeting. Rd50-2551 Sensors. S1. S2. L. S3. Properties Provided by Micron semiconductor Limited. FZ (float Zone) technology >8 cm N on P V dep = 40V V dep(expected) = = 43.3V
E N D
IIV and CV Measurements of rd50-(2551-6, 2551-4, 2552-7) Sadia Khalil VELO Group Meeting
Rd50-2551 Sensors S1 S2 L S3
Properties Provided by Micron semiconductor Limited • FZ (float Zone) technology • >8cm • N on P • Vdep = 40V • Vdep(expected) = = 43.3V • Thickness = d = 312m
Properties Provided by Micron semiconductor Limited • FZ (float Zone) technology • >8cm • N on P • Vdep = 40V • Vdep(expected) = = 43.6V • Thickness = d = 313m
S1 S2 L S3