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BI Review on Radiation Development and Testing

BI Review on Radiation Development and Testing. SPS Beam Position Monitors: MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013. Outline. SPS Multi Orbit POsition System (MOPOS) System overview Front-End Architecture Rad- tol requirements, design and status

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BI Review on Radiation Development and Testing

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  1. BI Review on Radiation Development and Testing SPS Beam Position Monitors:MOPOS Front-End Electronics Jose Luis Gonzalez BE/BI 22/11/2013

  2. Outline • SPS Multi Orbit POsition System (MOPOS) • System overview • Front-End Architecture • Rad-tol requirements, design and status • Possible impact and mitigation • Long-term radiation test planning and strategy BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  3. TT20 (SPS NA) BA2 BA3 BA4 ECA4 BA1 TT40 BA5 TT66 (HiRadMat) BA7 TI2 (LHC) ECA5 TT60 BA6 TT41 (CNGS) TT10 (PS) TI8 (LHC) SPS Multi Orbit POsition System (MOPOS) • MOPOS Front-End • 216 BPMs in the tunnel • Exposed up to 100Gy/y • Optical transmission • MOPOS Read-Out • In surface buildings (BA1...6) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  4. MOPOS: Simplified Block Diagram y U Serial ADC 10MHz FPGA LogAmps L R Optical Link @ 2.4 Gb/s Pickup x D Analogue Board Digital Board SPS Tunnel FPGA Front-End CHASSIS Radio Frequency Timing Distribution VME Interface Software Read-Out Board BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  5. Front-End Architecture BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  6. Analogue Board • Log-Amps • AD8302 • ADL5519 • MAX2016 • ADC Drivers • ADA4932-2 • THS4521 • Voltage regulators • LT1963AEQ • TL1963-KTT • LP3875-ADJ • TPS7A4501-KTT BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  7. PSI Irradiation Facilities (PIF) • Energy: 230 MeV • Flux: 1.6 108 p/cm2 s • Fluence: 1.874 1012 p/cm2 • Current: 4.7 nA • Collimator: 58 mm (Si) • Dose/run: 1 kGy - 105 rad/3.5 h BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  8. PSI: Analogue Test Setup BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  9. LogAmp ADL5519 & ADC-Drivers BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  10. Analogue Components • LogAmps • AD8302: Analog Devices, Dual Log Amps • ADL5519: Analog Devices, Dual Log Detector • MAX2016: Maxim, Dual Log Detector • ADC Drivers • ADA4932: Analog Devices, Differential ADC driver • THS4521: Texas Inst., Differential ADC driver • These components have been qualified at PSI (TID 1kGy) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  11. Voltage Regulators BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  12. Analogue Components • Low Dropout Regulators • LT1963A: Linear Tech.,LDO Regulator (1/3 bad) • LP3875: National Semi., LDO Regulator (3/3 bad) • TL1963A: Texas Inst.,LDO Regulator • TPS7A4501: Texas Inst.,LDO Regulator • These components have been qualified at PSI (TID 1kGy) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  13. Optical Transceivers Test Board Commercial SFP Modules • Double-fiber SFP • FTTX Technology: FT3A05D • Single-fiber, bidirectional • Ligent: LTE5350-BC and LTE3550-BC • Lightron: WSP24-313LC-I5A and WSP24-513LC-I3A • Source Photonics: SPL-35-GB-CDFM and SPL-53-GB-CDFM • Yamasaki: 541315L-15B and 541315L-15Y BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  14. PSI Test Setup • Energy: 230 MeV; Current: 2nA (~3.5 rad/s) or 3 nA(~6 rad/s); Collimator: 58 mm (Si) • TID goal: 1 kGy - 105 rad/component • Measurements every second: • Communication rate: 1.25 Gb/s • 32-bit word sent from the controller board (FPGA, Spartan6) • Electrical loopback on the SFP Board • Cross-check between sent and received 32-bit word • 2 SFP modules tested in parallel • For each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  15. Measurements – Best SFP Parts BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  16. SFP Test Results Summary • Ligentand Yamasaki components are very sensitive to the radiation level @ PIF • Source-Photonics components are more resistant but with many error bursts • FTTX and Lightron components behave much better but still generate many error bursts • For the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERN TESTS to be done with long transmission fibres (up to 1.5 km) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  17. CERN VTRx Radiation Specs Versatile Link Technical Specification, rev. 2 [J. Troska et al.] BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  18. Short-Term Strategy • Current Front-End Digital PCB (vers. 1) • Analog Devices Octal14-bit ADC: AD9252 • Xilinx Spartan6 FPGA (Triplication, Hamming Code Correction…) • CERN VTRX Optical Transceiver • Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software) BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  19. Long-Term Strategy: Radiation Tests for ADC & Digital Parts • Beam Tests Conditions: equivalent to PSI Test Beams (230 MeV; TID: 1 kGy) • In our section there is no manpower available in 2014 BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  20. Analogue/Digital Converters • 40…65Msps – LVDS Serial ADC • AD9252: Analog Devices Octal 14-bit • AD9259: Analog Devices Quad 14-bit • LTM9009: Linear Tech.Octal 14-bit • LTC2171: Linear Tech.Quad 14-bit • ADS5294: Texas Inst. Octal 14-bit • ADS6442: Texas Inst. Quad 14-bit BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  21. ADC Radiation Tests (H. Takai/BNL) TWEPP2013 BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  22. Digital Components • Low Voltage and LVDS Buffers • 74VCX162244: Fairchild 16-bit Buffer/Line Driver • 74ALVCH162244: Texas 16-bit Buffer/Line Driver • 74VMEH22501: Texas 8-bit Bus Transceiver • FIN1108: Fairchild 8-port LVDS Repeater BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  23. Digital Components: FPGA • SERDES integrated – SRAM technology • Xilinx SPARTAN6 (currently used) • Test of the first board prototype: SPS – 2014 • Altera Stratix V • Cycling Redundancy Check of FPGA configuration • Possibility to get the corresponding ASIC • External SERDES  FPGA + GBT project • SRAM – if failures are mostly related to SERDES • Antifuse – MicrosemiAxceleratorAX2000 • Flash RAM – for SRAM configuration • M25P128 – Numonyx BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  24. THANK YOU FOR YOUR ATTENTION! BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  25. Spare Slides: PSI Radiation Tests BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  26. PSI: SFP Radiation Setup BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  27. SFP Tests: FTTX FT3A05D BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

  28. SFP Tests: Lightron I3A BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/2013

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