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Memory CTL Sub Teams. Proposed Milestones and Timeline. Pin Level Functions. Members Sirinvas (Leader), Karen, Nicco Scope: Define CTL construct to describe all memory pins that may affect memory test to enable seamless integration of Test Pin Information Pin Name Pin Range [L..R]
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Pin Level Functions • Members • Sirinvas (Leader), Karen, Nicco • Scope: • Define CTL construct to describe all memory pins that may affect memory test to enable seamless integration of Test • Pin Information • Pin Name • Pin Range [L..R] • Direction (Input, Output, InOut) • Logical Port relationship • Polarity (Active High/Low) • Pin Function Data, Address, BistClock, ReadEnable, WriteEnable, ReadWriteEnable, MasterClock, BistEnable, SlaveClock, ScanClock, GroupWriteEnable, GroupReadWriteEnable, (None), Open, OutputEnable, ScanTest, ByPassEnable, MemSelect, ShiftEnable, Active, CAS, RAS, Refresh, ECCDisable, PipelineEnable, [User defined], CAMComparandInput, CAMComparandMask, CAMCompareEnable, CAMMatchOutput, CAMMatch, CAMMultiHit, CAMMatchAddress; ECCEnable, ECCTestInput, ECCDataOutput, ECCOuputEnable, <Repair Related Functions>, <Timing Margin Related Functions>, <ECC Correction>, <ECC Error>, <Power Down Functions>, <CAM Reset>, <Scan Clock Enable>, <Sync bypass Clock>, <MRAMs pin functions>, <Flash Memory Pin Functions>, <External memory pins>, <NVM pins>, • Mile Stone: Draft Document by Feb 2007