1 / 19

Boundary-Scan driven Vectorless Testing on Active Components

Boundary-Scan driven Vectorless Testing on Active Components. Steve Hird Loveland, CO. Purpose. Describe a methodology that extends Boundary-Scan driven Vectorless test to include active components. Outline. Review Existing technology used for connectors

janna
Download Presentation

Boundary-Scan driven Vectorless Testing on Active Components

An Image/Link below is provided (as is) to download presentation Download Policy: Content on the Website is provided to you AS IS for your information and personal use and may not be sold / licensed / shared on other websites without getting consent from its author. Content is provided to you AS IS for your information and personal use only. Download presentation by click this link. While downloading, if for some reason you are not able to download a presentation, the publisher may have deleted the file from their server. During download, if you can't get a presentation, the file might be deleted by the publisher.

E N D

Presentation Transcript

  1. Boundary-Scan driven Vectorless Testing on Active Components Steve Hird Loveland, CO

  2. Purpose Describe a methodology that extends Boundary-Scan driven Vectorless test to include active components.

  3. Outline • Review Existing technology used for connectors • Examine the unique challenges of active components • Examine some target devices • Conclusions

  4. Using Boundary-Scan for Test Stimulus in VTEP test. • Combine Boundary-Scan drivers with TestJet/VTEP sensors. • Use Boundary-Scan drivers in place of In-Circuit drivers for guarding and stimulus, but retain capacitive pickup of signal.

  5. Using Boundary-Scan for Test Stimulus • What are the advantages of this ? • Test pins whose signals are not accessible • Can eliminate access (cheaper fixtures) • Validates the investment in Boundary-Scan

  6. Boundary-Scan interface Picture from paper 11.2 ITC 2008. Using Boundary-Scan for Test Stimulus What are the advantages of this ?

  7. What are the challenges with active components? • Silicon devices require accurate setup information. • Connectors require very little pin information for test generation. Most of the information is external and gathered from the node data. All pins are considered either fixed or inputs.

  8. Required Setup Information • Pin orientation: Input, Output, Bidirectional • Disabling information (DUT): All bidirectional, output and buffer pins require disabling • Disabling all devices involved in test (connected to DUT)

  9. Incomplete Disabling Problems • Sequential logic creates variability in response • Signals may add or cancel from run to run • Causes high standard deviation.

  10. Standard Deviation and Testability • Cpk = (Mean-LL)/(3 x Std Dev) • Cpk 1.5 = 99.865% Yield • Cpk 1.0 = 93.3% Yield

  11. Experimental Results – Incomplete Disabling

  12. Experimental ResultsSi Parts Evaluated – DDR2 * Coverage before resolving issues discussed on next two slides.

  13. Experimental Results – DDR2 FBGA

  14. DDR2 FBGAs are Challenging but Testable • Small part geometries and lead frame yield small signal on Vtep Sensor plate • Care must be taken to minimize on board noise sources

  15. Si Parts Evaluated – SRAM, DRAM * Coverage before resolving issues discussed on next two slides.

  16. Experimental Results – DRAM QFP

  17. Results of Experiments • Learnings • Noise from surrounding circuits should be minimized for best results • Disable DUT and connected devices for test stability and increased coverage • Lead frame geometry plays important role (similar to any Vtep test)

  18. Conclusion • Active components can be tested using Boundary-Scan driven Vectorless Test Technology • Proper disabling is critical • Eliminating on board noise sources will increase coverage • Technique reduces need for access

  19. Thank You!

More Related