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Electrical Power Engineering Department Hijjawi Faculty of Engineering Technology Yarmouk University Irbid, Jordan. Effect of High Frequency Pulses on the Breakdown Voltage and Lifetime of MW Insulation of Flyback Transformer. Eyad A. Feilat, Ph.D. US-Jordan Workshop
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Electrical Power Engineering Department Hijjawi Faculty of Engineering Technology Yarmouk University Irbid, Jordan
Effect of High Frequency Pulses on the Breakdown Voltage and Lifetime of MW Insulation of Flyback Transformer Eyad A. Feilat, Ph.D. US-Jordan Workshop Modern Power Electronics Research and Education December 16-17, 2002, PSUT, Amman, Jordan
Outline • Design Trends in Electrical and Electronics Equipment • Insulation System of Flyback Transformer • Consequences of Miniaturized Design • Statistical Analysis of Failures • Scope of the Research Paper • Accelerated Aging Test System • Experimental Results • Conclusion
Design Trends inElectrical and Electronics Equipment • Reduce Size (Compact Design) • Light Weight • High Reliability (Low Failure Rates) • Reduce Manufacturing Time • Reduce Cost
DesignTrends inElectrical and Electronics Equipment • Bobbin-Wound Coils • Fine Gauge Magnet Wires • Thin Layers of Insulation • Encapsulation of HV Coils • Materials with High Thermal Class • High Frequency Switching Technology • DC-DC Converters (Flyback Transformers) • DC-AC Inverters (Adjustable Speed Drives)
DC-DC ConverterFlyback Transformer (FBT) • Fine Gauge Magnet Wires (MW) • TV sets and computer monitors.
Polyester Housing Layer (Polyethylene Terephthelate) Impregnation Layer (Epoxy) Heavy Build Enamel (Polyurethane) Polyester Bobbin (Polyethylene Terephthelate) Insulation System of Encapsulated Coil • Randomly Wound on Bobbins • Bonded with Baked Coatings • Encapsulated with Epoxy
Magnet Wire (MW) Insulation Material: polyurethane(PUR) Over Coat: Polyamide (Nylon) NEMA MW-80C, Class F AWG 41 MW Insulation Thickness = 6.35 m Bare Wire Diameter = 71.1 m
Consequences of Miniaturized Design • Random Wound Coils • Beginning and End of the Coil may touch one another • High Level of Voltage Stress between Turns • High Frequency Switching • Very Short Pulse Period • Very Short Duty Cycle • High dV/dt • Uneven Voltage Distribution • Steady Degradation of the MW Enamel • High Temperature Rise, typically 100o-200o C
Causes of Insulation Failure • Electrical and Thermal Stresses • Partial Discharge Developed in Random Windings • Localized Dielectric Heating • Microvoids and Impurities in the Epoxy Fill Material • Insulation Degradation • Premature Failure
Statistical Analysis of Failures • Accelerated Life Tests (Accelerated Aging) • High Electrical Stresses • Elevated Temperatures • Combined Electrical and Thermal Stresses • Various Voltage Waveform and Frequencies
Statistical Analysis of Failures • Probability Distribution (Weibull) • Life Model (Single Stress, Multistress)
Scope of the Study • Effect of Rise Time on the Time-to-Failure • Effect of Duty Cycle on the Time-to-Failure • Evaluation of the Breakdown Voltage • Accelerated Life Tests • High Temperature (100o -180o C ) • Pulsating Frequency (15-40 kHz) • Positive Polarity
Accelerated Aging System DTS-1500 A
D V T Typical Pulse Waveform
Experimental Results • Lifetime Studies • Effect of Duty Cycle • Effect of Rise Time
250 200 150 Time-to-Breakdown (s) 100 50 0 10 15 20 25 30 35 40 45 50 55 Duty Cycle % Effect of Duty Cycle V = 950 V f = 15 kHz T = 100o C t = 200 ns
Effect of Rise Time V = 950 V f = 15 kHz T = 100o C D = 16%
Experimental Results • Breakdown Voltage Studies • Effect of Temperature • Effect of Frequency
Effect of Temperature on the Breakdown Voltage D = 16% t =200 ns
Effect of Frequency on theBreakdown Voltage D = 16% t =200 ns
Experimental Results • Lifetime Studies • Effect of Pulsating Voltage • Effect of Temperature • Effect of Frequency
Lifetime CharacteristicsV-t C/C f=15kHz 155o C 180o C 100o C
Lifetime CharacteristicsV-t C/C 1.0E+8 T=155o C 15 kHz 25 kHz 1.0E+7 40 kHz 1.0E+6 Time (s) 1.0E+5 1.0E+4 1000.0 100.0 600.0 680.0 760.0 840.0 1000.0 920.0 Voltage (V)
Lifetime CharacteristicsT-t C/C f=15kHz 800 V 900 V 700 V
Lifetime CharacteristicsT-t C/C V=800V 25 kHz 40 kHz 15 kHz
Conclusion • The longer the duty, the shorter is the insulation Lifetime • The longer the rise time, the longer is the insulation lifetime • The Breakdown Voltage declines with the increase of both the Frequency and Temperature • The Accelerated Life Tests show that both the Voltage and Temperature are the two main Factors of Insulation Aging or Degradation
Conclusion • Effect of the pulse frequency on the lifetime is indistinct • It changes with temperature and voltage stress • Reason: • Change of polarization • Space charge • Dielectric losses • Change of Breakdown Mechanisms