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Operando XAS and Synchrotron XPS for surface characterization of SOFC electrodes

Operando XAS and Synchrotron XPS for surface characterization of SOFC electrodes S. Y. Lai, D. Ding, X. Li, M. Liu, F. M. Alamgir, and M. Liu, Georgia Tech . Operando XAS setup. XPS carbonate detection.

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Operando XAS and Synchrotron XPS for surface characterization of SOFC electrodes

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  1. Operando XAS and Synchrotron XPS for surface characterization of SOFC electrodes S. Y. Lai, D. Ding, X. Li, M. Liu, F. M. Alamgir, and M. Liu, Georgia Tech Operando XAS setup XPS carbonate detection Accomplishment:Developed glancing angle XAS technique to characterize SOFC electrodes under operating conditions and gas contamination. Experiments show correlation between degree of oxidation shift, temperature, polarization resistance, and H2O/CO2. In situ synchrotron XPS described evolution of carbonate, hydroxide, and oxide species according to temperature and H2O/CO2 exposure. Significance:In situ synchrotronXPS and operando glancing XAS give electronic, atomistic, and surface-specific information, which can be combined to gain insight into gas interaction and electrode degradation mechanisms. Techniques are also adaptable to studying other types of heterogeneous functional materials for purposes of guiding and inspiring rational materials design. Correlation between oxidation state and Rp Co local structure distortion from H2O exposure Oxide species detection by XPS Oxidation and reduction of Fe and Co by H2O and CO2

  2. Operando XAS and Synchrotron XPS for surface characterization of SOFC electrodes S. Y. Lai, D. Ding, X. Li, M. Liu, F. M. Alamgir, and M. Liu, Georgia Tech Model electrode in operando testing cell Future Directions • Augment spectroscopic information with computational data from collaborators for confirmation and verification of proposed mechanisms. • Applying knowhow of XAS to study gas interactions of SOFC anodes, cathodes, and catalysts, especially poisoning mechanisms, and other heterogeneous functional materials under operating conditions. XAS can uniquely provide both element-specific information on electronic and atomistic structure with emphasis on bulk or near-surface regions of interest, which isolates the role of different elements in complexly doped stoichiometries. • Support the development of novel heterogeneous functional materials, particularly of conformal thin films via infiltration of porous substrates, using highly resolved synchrotron microprobe spectroscopy to elucidate the evolution process of structure and interfaces and as a guide for rational materials design and selection. X-ray microbeam In situ XPS, XRD X-ray Raman XAS spectrum XAS simulations

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