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FCAL. C ollaboration. High precision design. Lumi Cal Towards electronics design. Halina Abramowicz, Ronen Ingbir, Sergey Kananov, Aharon Levy, Iftach Sadeh. Tel Aviv University. 22/11/2006. Signals in Units of Ch arge. Sensors Area Sensors Thickness. Phys ic s Sample.
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FCAL Collaboration High precision design LumiCal Towards electronics design Halina Abramowicz, Ronen Ingbir, Sergey Kananov, Aharon Levy, Iftach Sadeh Tel Aviv University 22/11/2006
Signals in Units of Charge • Sensors Area • Sensors Thickness Physics Sample • 250 GeV MIPS (Muon sample) • 250 GeV electrons (contained EM showers)
Calculating the Charge Induced in Silicon Energy to create electron/hole pair Electron Charge Number of Electrons Signal Charge
MIP Energy Loss in Silicon Energy loss (250Gev MIP): ( See:http://lhcb.physik.unizh.ch/software/doc/loss.pdf) Energy deposited for of silicon This number was also verified in simulation. Cracow’s (Bogdan’s) number (from simulation) is somewhat higher.
MIP Energy Loss in Silicon Energy to create electron/hole pair Charge of 1 electron MIP signal for of silicon
10 cylinders (θ) 60 cylinders (θ) Cylinders (mrad) 14 11 layers (z) 15 layers (z) 4 layers (z) Present Understanding (pad option) Based on optimizing theta measurement 9
10 cylinders (θ) 60 cylinders (θ) 11 layers (z) 15 layers (z) 4 layers (z)
High Gain ADC Low Gain Digitization Model The Goal: a resolution of 5 bins per MIP Maximal charge per sensor + buffer FCAL -- TAU
Digitization Model • MIP per bin. • 2. Maximal Shower Charge (electrons) • events cell signal • events cell signal
Summary – 8 Bit Digitization MIP signal for of silicon is for a maximal signal of we therefore have . High gain steps Low gain steps of the Cells are in the high gain region.