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Programmable Low-Pass Filter Automated Characterization System. Andrei Branescu. Table of contents. Test Plan Characterization system presentation Characterization program implementation Results Conclusions. Parametrii blocului testat. 5’th order Bessel type low-pass filter
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Programmable Low-Pass Filter Automated Characterization System Andrei Branescu
Table of contents • Test Plan • Characterization system presentation • Characterization program implementation • Results • Conclusions
Parametrii blocului testat • 5’th order Bessel type low-pass filter • Programmable cutoff frequency in 4 ranges: 1Mhz – 40MHz • 9 bits for frequency settings(512 settings)
GdB GdB 3dB GB f f fc Characterization target Cutoff frequency Gain • Frequency characteristics determination • Determine constant region • Determine gain on constant region • Determine passband gain • Determine the frequency for witch the gain drops with 3dB rapported to band gain
Table of contents Test Plan Characterization system presentation Characterization program implementation Results Conclusions
Table of contents Test Plan Characterization system presentation Characterization program implementation Results Conclusions
Test module components • Gain measurement module • Cutoff frequency measurement module • Communication modules
Table of contents Test Plan Characterization system presentation Characterization program implementation Results Conclusions
Tests • Tested chips: 10 – once • 4 chips – another 9 tests for each
Table – all chips suspicious
Conclusions • Automated filter characterization • Measurements: Cutoff frequency • Created modules: Automated testing module Results diplay module • 10 tested chips • 4 chips tested 10 times • Chip 27 – broken • Range 4 – design error