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Compliance Committee Joint Promotion WG Introduction of Verification tool for Ver.3x

Compliance Committee Joint Promotion WG Introduction of Verification tool for Ver.3x. Tokyo Electron Device Agilent Technologies Presented by Agilent Technologies Ai-Lee Kuan April 15 th , 2010 SDA GA in Chicago. Introduction Do you know what your SD signal look like ?. CLK.

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Compliance Committee Joint Promotion WG Introduction of Verification tool for Ver.3x

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  1. Compliance CommitteeJoint Promotion WG Introduction of Verification tool for Ver.3x Tokyo Electron DeviceAgilent Technologies Presented by Agilent Technologies Ai-Lee Kuan April 15th, 2010 SDA GA in Chicago

  2. Introduction Do you know what your SD signal look like ? CLK Command / Response DATA 0 to 3 SD Card SD Host VDD/ Power and Ground Agilent Technologies Mixed Signal Oscilloscope CLK(Yellow) CMD (Red) DATA0 (Green) Looking the CLK/CMD/DAT0~3 Edge timing (Logic Analyzer) May not always explain well enough of your product’s behavior.

  3. Introduction Do you know what your SD signal look like ? High Speed 3.3V 25Mbps/50MHzCLK Cross Talk CLK CLK(Yellow) CLK Jitter(Blue) CMD (Red) DAT DATA0 (Green) Data/CMD signal The Analog waveform characteristic is also a KeyBecoming more important for UHS-I.

  4. Introduction Do you know what your SD signal look like ? Rx Tx Two Basic test for SD CARD electrical compliance CLK Command / Response DATA 0 to 3 SD Card SD Host VDD / Power and Ground Setup1. Is your RX working OK ?Receiving CLK/CMD/DATA with all different in-spec waveform. Setup2. Is your TX signal OK?Check READ operation CMD/DATA signal are in-spec waveform and timing.

  5. Coverage Coverage of the TesttoolTwo different configurations. Setup 1: TED (Tokyo Electron Device) Board + Windows PC (Rx test) Change waveform Parameters and verify Read/Write operations(Variable power supply voltage/ CLK & DAT signal level and timings) Setup 2: TED (Tokyo Electron Device) Board + Agilent Oscilloscope (Tx test) Waveform measurement tests during Card operationsAutomated Oscilloscope measurements +

  6. Coverage Setup1: TED Board +Windows PC Coverage of the TesttoolSupports Physical Test Specification for CARD Ver. 3.00 Electrical Characteristics 6-1-1 Threshold Levels (DS/HS) 6-1-3 Supply Voltage (DS/HS) 6-1-6 Bus Timing (DS/HS) 6-2-1 Threshold Levels (SDR12,25,50,105/DDR50) 6-2-3 Power Supply (SDR12,25,50,104/DDR50) 6-2-10 CMD/DAT Input Timing for SDR 6-2-14 CMD/DAT Input and Output Timing for DDR (DDR50) What kind of test can be done with our tool ? With combination of Tokyo Electron Device SD Card Signal Quality test boardWindows PC and Tokyo Electron Device GUI application software. Provides automated SD CARD Read / Write tests Under Different Analog Electrical Conditions.

  7. Variable Analog Condition READ/WRITE SD Card Under Test Feature Setup1: TED Board + Windows PC Windows PC USB GUI Application Software (provided by TED) TED Board (provided by TED) “TD-BD-SD CMP Test C”

  8. Feature Setup1: TED Board + Windows PC All Runs In your Laptop ! Feature of our tool Select Test Simple operation. Auto Report

  9. Coverage Setup2: TED Board + Agilent Oscilloscope Coverage of the TesttoolSupports Physical Test Specification for CARD Ver 3.00 Electrical Characteristics and Timing Measurements6-1-4 Current Consumption (DS/HS)6-1-6 Bus Timing (DS/HS) 6-2-5 Current Consumption (SDR12,25,50,105/DDR50)6-2-8 Output Drivers Strength (SDR50,104)6-2-11 CMD/DAT Output Fixed Timing (SDR25,50)6-2-12 CMD/DAT Output Variable Timing for SDR (SDR104)6-2-14 CMD/DAT Input and Output Timing for DDR (DDR50) What kind of test can be done with our tool ? With combination of Tokyo Electron Device SD Card Signal Quality test boardand Agilent Technologies 9000A/90000A Oscilloscopes Provides Industry First Automated Oscilloscope solutionfor SD CARD Signal Quality Tests

  10. Feature Feature of our tool SD Card Under Test Setup2: TED Board + Agilent Oscilloscope Windows BasedAgilent 9000A/90000AOscilloscopes CLK/CMD/DAT0-3Active Probes (1.5GHz~) VddCurrent Probes USB Test Point Trigger Built In software runs auto testing for you.Config, Measure and Reporting

  11. Feature Feature of our tool Connect Auto Run Auto Report Setup2: TED Board + Agilent Oscilloscope All Runs Inside Oscilloscope Windows BasedAgilent 9000A/90000AOscilloscopes Select Test Simple operation.

  12. Feature Feature of our tool Setup2: TED Board + Agilent Oscilloscope CLK Eye diagramand Timing window DAT/CMD DAT Current Consumption during Read / Write operation Vdd Current Fast, Accurate, Repeatable and Simple

  13. Status of evaluation How many volunteer companies are evaluating our tool The plan & result Three Volunteer companies from SDA evaluating our Tool.Three companies waiting for final evaluation. (2010 Apr 5th) SD HOST testing solution in our roadmap 2010

  14. Contact Contact for detail information Tokyo Electron DeviceHiroshi Muto mutoh.h@teldevice.co.jp http://www.teldevice.co.jp/ Agilent Technologies USAi-Lee Kuan ai-lee_kuan@agilent.com Agilent Technologies JapanKen Sakataken_sakata@agilent.com www.agilent.com

  15. Demonstration We demonstrate Test LIVE !! Please bring your SD Card with you !!DS/HS/SDR12,25,50,104/DDR50 supported Today 13:00~17:00 @ Compliance Test Tool Demo Room

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