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Design and fabrication of electrical measurement system for microchannel plates (LAPD weekly group meeting) Feb-01-2011. Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group Energy Systems Division. Objective:.
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Design and fabrication of electrical measurement system for microchannel plates (LAPD weekly group meeting) Feb-01-2011 Anil Mane, Qing Peng, Jeffrey Elam ALD Research Program, Process Technology Research Group Energy Systems Division.
Objective: To build UV-based gain measurement set up for quick ALD functionalized MCP performance test
Photograph of gain measurement setup: A new EMWCD submitted in Oct 10 and approved in first week of Jan 11 Dual MCPs testing (Possible to load 3 MCPs) pA current meter 3 high voltage (0-5kV) DC power supply • Ready to test MCP • Test 1-2 MCP per day (cause by small capacity turbo pump)
HW design for MCP Gain test Shielded UV source for electron generation Electrical connections Drain resistors box
Photograph of MCP(s) holder assembly: Al anode MCP top contact • MCP 114 is loaded on the holder and will be tested Anode and MCP bottom contact separated with insulating spacers
I-V data with now set-up: R=60M • Connections are ok
System capabilities: • Current vs. Voltage (I-V) • Resistance vs. Temperature (R-T) (Thermal coefficient , activation energy) • Resistance vs. Time (R-t) @ fix HV • Gain vs. voltage • Long term stability under scrubbing condition • Two optical windows (possible to get thermal imaging with CCD)