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RECFA @ NIKHEF Industrial Collaboration: PANalytical

RECFA @ NIKHEF Industrial Collaboration: PANalytical. Tech-transfer, Applications and new Developments in X-ray Materials Analysis. Outline. Background / Company Medipix Tech-Transfer First highlights on detector properties Expectations for XRD applications New EUREKA project “RELAXD”

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RECFA @ NIKHEF Industrial Collaboration: PANalytical

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  1. RECFA @ NIKHEF Industrial Collaboration: PANalytical Tech-transfer, Applications and new Developments in X-ray Materials Analysis RECFA Meeting, Sept. 05

  2. Outline • Background / Company • Medipix Tech-Transfer • First highlights on detector properties • Expectations for XRD applications • New EUREKA project “RELAXD” • Conclusions (Relevance of collaborations, funding) RECFA Meeting, Sept. 05

  3. Main Activities X-ray Diffraction and Fluorescence for Science and Industry Winning by Sharing know-how and experience in X-ray diffraction and fluorescence RECFA Meeting, Sept. 05

  4. Main Activities • XRF (Industry and Research) • Elemental Analysis (qualitative and quantitative) • Applications: Cement, Petrochemical, Plastics,Steel, Aluminium, Environmental, Geology • Automation • XRD (Research and Industry) • Phase Analysis (qualitative and quantitative) • Some applications: Pharmaceuticals, Cement, Minerals • Advanced Materials, Thin Films and Semiconductors, Nanotech, • Automation RECFA Meeting, Sept. 05

  5. Axios Product range XRF (Elemental Analysis) CubiX MiniMate MiniPal 2 Venus MagiX FAST RECFA Meeting, Sept. 05

  6. (First) Collaboration XR F & D RECFA Meeting, Sept. 05

  7. Key Modules RECFA Meeting, Sept. 05

  8. XRD: X’Pert PRO MRD • Advanced X-ray analysis for new materials research and development • For thin films, semiconductors and microstructures,nano-research RECFA Meeting, Sept. 05

  9. X’Pert PRO MRD XL • X-ray analysis for research and process development of advanced materials • Analysis of wafers up to 300 mm diameter • Automatic wafer loading RECFA Meeting, Sept. 05

  10. X’Pert PRO MRD XL • X-ray analysis for research and process development of advanced materials • Analysis of wafers up to 300 mm diameter • Automatic wafer loading RECFA Meeting, Sept. 05

  11. X’Celerator • The standard in X-ray powder diffraction • Speed and resolution • Rapid data collection of complete powder diffractograms RECFA Meeting, Sept. 05

  12. CSI MIAMI • FORENSIC SCIENCE RECFA Meeting, Sept. 05

  13. Outline • Background • Medipix Tech-Transfer • First results on detector properties • Expectations for XRD applications • First results of Medipix in XRD • New EUREKA project “RELAXD” • Conclusions RECFA Meeting, Sept. 05

  14. Acknowledgement Leader Medipix group @ NIKHEF + partnership new RELAXD project Chip design Spokesman Medipix coll. Tech-transfer Office +combined exhibitions IEEE/Rome, Salon Paris Funding RELAXD IS 051 010 NIKHEF team Jan Visschers Hans Verkooijen, Ton Boerkamp CERN team Michael Campbell Xavier Llopart Erik Heijne CERN ETT Marilena Streit-Bianchi Beatrice Bressan Ministry EZ / Netherlands RECFA Meeting, Sept. 05

  15. PARIS: Salon de la Recherche et l’Innovation RECFA Meeting, Sept. 05

  16. Medipix Collaboration • Univ + INFN Cagliari • CEA-LIST Saclay • - CERN Genève • Univ d'Auvergne • - Univ Erlangen • - ESRF Grenoble • - Univ Freiburg • - Univ Glasgow • - IFAE Barcelona • - Mitthoegskolan Sundsvall • - MRC-LMB Cambridge • - Univ + INFN Napoli • - NIKHEF Amsterdam • - Univ + INFN Pisa • - FZU CAS Prague • IEAP CTU Prague • SSL Berkeley Spokespersons: Michael CAMPBELL CERN Jan VISSCHERS NIKHEF RECFA Meeting, Sept. 05

  17. Medipix 2 chip / detector RECFA Meeting, Sept. 05

  18. Comparison with state-of-art detectors RECFA Meeting, Sept. 05

  19. First shot: direct beam RECFA Meeting, Sept. 05

  20. Direct beam Linear scale Logarithmic scale RECFA Meeting, Sept. 05

  21. R&D: Medipix collaboration - PANalytical RECFA Meeting, Sept. 05

  22. <00l> <624> Linear array Si Strip detector Micro–high-resolution wafer mapping Single 100 m sampled region Signal peak <0.25 photons/s “Static” measurement geometry for wafer screening of CdHgTe diode arrays for thermal imaging cameras X-rays Background noise after 100 s count time ~0.005 photons/s • Discrimination on every photon separates very weak scattering from random noise in measurement • Signal peak gets enhanced with counting time • Random residual noise statistically cancels with counting time • Results in an enhanced dynamic range RECFA Meeting, Sept. 05

  23. Still weaker signals; very small residual noise Signal peak ~0.1 photons/s Signal peak ~0.06 photons/s Single 50 m sampled region Single 50 m sampled region Background after 100 s count time <0.002 photons/s Background after 100 s count time <0.001 photons/s RECFA Meeting, Sept. 05

  24. Outline • Background • Medipix Tech-Transfer • First results on detector properties • Expectations for XRD applications • First results of Medipix in XRD • New EUREKA project “RELAXD” • Conclusions RECFA Meeting, Sept. 05

  25. RELAXD High REsolution Large Area X-ray Detector Fully tiled X-ray imager need pitch adapter Gbit/s serial readout Innovation Project Funded RECFA Meeting, Sept. 05

  26. RELAXD Partners RELAXD Consortium • CANBERRA Olen, Belgium • IMEC Leuven, Belgium • NIKHEF Amsterdam, Netherlands • PANalytical as Penholder: Almelo, Netherlands RECFA Meeting, Sept. 05

  27. The Future: Medipix2 tiling through-via etching wafer thinning 3D stacking RECFA Meeting, Sept. 05

  28. Financials / Funding of RELAXD Cost & Subsidy • 2690 kE total project ========================================== • 1138 kE PAN 60% funding => 683 kE EZ • 922 kE NIKHEF => 553 kE EZ========================================== • 633 kE CANBERRA ~50% funding => 331 kE IWT • 0 IMEC funded by CAN mainly and also by PAN ========================================== • Status: • approved in NL, already started since Sept 1st • in the approval phase in Belgium • Jan ‘06 Eureka labelling RECFA Meeting, Sept. 05

  29. Meaning of RELAXD CERN CANBERRA Relevance: PAN Detector Center Medipix 2 IMEC Detector chip production CMOS process (0.25 m) NIKHEF Large® area PANalytical Medipix + , ++ Pixel intelligence 0.13 mu, 0.09 mu CMOS (MCNC) ….Super-chip, >RELIABLE< Various shapes&sizes Plus spin-offs PANalytical (+Canberra) RECFA Meeting, Sept. 05

  30. Conclusions portunity Observations to R & I & G (Research / Industry / Government) • Relevance of Collaborations R&I • Developments of high degree of complexity – high-tech products only possible together (good tech-transfer) • Money reflow into the special research groups • Spin-off activities improve processes in e.g. yield, stability, and performance of devices (with input from both, R&I) RECFA Meeting, Sept. 05

  31. Conclusions cont. portunity Observations to R & I & G (Research / Industry / Government) • Relevance of Funding • Financial means of both, R&(medium sized) I, are limited • Order of millions for a R&D project requires involvement of funding • Improve compatitive strength of Europe • Enabling technologies are essential and contribute to the benefit for the society RECFA Meeting, Sept. 05

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