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Chapter 6. Control Chart Example. Is there special cause variation present? Does it look normal?. When do I make a change to the process?. Is the process in control?. Is there a pattern?. Is measurement variation having a big effect?. Remember Walter Shewhart ?
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Control Chart Example Is there special cause variation present? Does it look normal? When do I make a change to the process? Is the process in control? Is there a pattern? Is measurement variation having a big effect? Remember Walter Shewhart? He is credited with the control chart. We will refer to these as the Shewhart Methods.
Why chart? • We need to have an accurate, efficient way to determine how well the process is running • Control charts give you the ability to look at groups of data from processes and conclude how well it is performing • It lets an individual easily identify patterns, trends, cycles, points out of control, etc.
Gas Price Example …from a long, long time ago.
Example • Look at the data in the table on the previous page (2 min) and make a decision on the data: • In what 2 months did the highest gas price occur and at what price? • In what 2 months did the lowest gas price occur and at what price? • What is the range of the gas prices? • In what 2 consecutive months did the largest change in gas prices occur? • Is there a trend in the data?
Variables vs. Attributes Data • Variables Data - Numerical measurements made at the interval or ratio level- quantitative data, • ohms, voltage, diameter, subdivisions of the measurement scale are conceptually meaningful, e.x., 1.6478 volts • Attribute data is data that takes on fixed values • counts, good or bad, on or off, right or wrong, values without intervals What are the advantages and disadvantages of each of these?
Median, Range 9 o Average, Range t 2 = n e r o m r o 0 1 = n Average, sigma s n t o n - n o r m a n n l d a t a = 1 e m Run chart s e n e o r l r m u b a l s a d i a a r t a e a IX control chart M V A t t d e x r i f C n i np control chart b o u u s n e c t e s i p n t s v a n t r i i e u s p control chart n o u C r o d e x i f n C c chart o u n t o c c u r e n c e s n v a r i e s u chart Control Chart Decision Tree Variable: Provides the most information Median, Range 9 9 Average, Range Average, Range o o t t 2 2 = = n n e e r r o o m m r r o o 0 0 1 1 = = n n Average, sigma Average, sigma s s n n o o n n - - n n o o t t r r m m n n a a l l d d a a = = t t a a n n 1 1 e e m m Run chart Run chart s s n n o o e e e e r r r r m m l l a a u u b b l l d d s s a a a a t t i i a a a a r r e e a a IX control chart IX control chart M M V V A A t t t t d d r r e e C C x x i i i i f f n n np np control chart control chart b b o o u u u u t t n n s s e e t t e e s c c s s s e e i i p p n n v v t t a a s s r r i i n n e e t t s s i i p control chart p control chart u u n n o o u u C C r r o o d d e e x x i i f f n n C C o o c chart c chart u u n n t t o o c c c c u u r r e e n n c c e e s s n n v v a a r r i i e e s s u chart u chart Attribute: Needs a lot of data Control chart – The basic tool of SPC
When do I get the data? You always need to take random samples. • At random times ~or~ • At regular intervals • Time based • Quantity based • Use “Rational Subgroups” • Small variation within groups • Large variation between groups (sources of variation that occur over time)
How much data do I need? • There is a very statistical way to calculate this, but we’re not going to go there • Let’s remember the assumptions: normal, homogeneous, need rational subgroups • Typical Shewhart Methods will state: • rational subgroups of 4, 5, or 6 if you have a lot of data recorded periodically, or • 100% for small sample sets • Based on process capability
What is a run chart? • A very simple technique used to analyze the process when other charting techniques are not applicable • Data is usually compared to a target value How am I doing?
Run chart • Used to get a graphical view of the data • Does not have control limits
Control chart control limits • Warning indicators • Drawn on the chart at +3 (UCL) and -3 (LCL) from the average • These limits define the boundaries which the measured subgroup of your process must fall into Process
Control limits • Another term for control limits are Natural Process Limits (NPL) • These limits will indicate or signal you if your process is operating in a state of statistical control, or if it is out of control
Statistical control • Shows if the inherent variability of a process is being caused by normal causes of variation, as opposed to assignable or non-normal causes
How distributions relate to control charts • A control chart is simply a distribution of values, turned 90 degrees on its side...
…and stretched out over time. This gives the advantage of seeing when an event occurs. It is highly recommended to use a histogram and control chart together. How distributions relate to control charts
11 step procedure for control charts • Select a process measurement • Stabilize process and decrease obvious variability • Check the gages (10:1, GRR) • Make a sample plan • Setup the charts and process log • Setup the histogram • Take the samples and chart the points • Calculate the control limits and analyze for control • Calculate the capability and analyze for capability • Monitor the process • Continuous Improvement
How to calculate control limits • As we discussed before, control limits are usually set at 3 from the mean For the range control chart: For the average control chart:
Class exercise • Exercise on pg 594/602 • 1-4 • Review Chapter 10 • Finish 5-7
Target Value Lower Limit Upper Limit Process Capability • Helps determine what the process can produce under normal, stable conditions • Helps set realistic goals for improvement by showing what to expect from the process • Main indices used to define process capability: Cp, CR, and Cpk, PPM, slevel • Make sure that our +/- 3sdistribution (99.73% of data) falls within the tolerance zone
What happens when “Shift happens”? • Because we are using all of our tolerance, we’re forced to keep the process exactly centered • If the process shifts at all, nonconforming parts will be produced Lower Specification Limit Upper Specification Limit Target
Getting started • Using 75% or less of a tolerance will allow processes to shift slightly without producing any defects • The goal is to improve your process in order to use the least amount of tolerance possible • Reduce the opportunity to produce defects • Reduce the cost of the process
Potential Process Capability Index (Cp) • Defines the width of the process distribution • Cp is calculated by dividing the tolerance zone width by the width of the ±3σ distribution • This Cp number (or index) tells how many times the distribution will fit into the tolerance zone * * Which standard deviation do I use?
What it looks like... • If a process uses 100% of a tolerance zone , the Cp value would be 1.0 • If a process uses 1/2 of the tolerance zone , the Cp value would be 2.0 • If a process uses 200% of the tolerance zone , the Cp value would be 0.5
Capability Ratio (CR=PCR) • Process capability as a percentage of tolerance • The inverse of the calculations for Cp • Divide the width of the ±3σ distribution by the width of the tolerance zone * * Which standard deviation do I use?
Calculating CR • If a processes Cp = 1.0 the CR = 100% • If a processes Cp = 2.0 the CR = 50% • If a processes Cp = .5 the CR = 200% neat
Actual Process Capability (Cpk) • Takes into account not only the spread of the distribution, but also the location of it as well • Calculating Cpk: * Cpk = Cp - a “Penalty” for off-center distributions! * Which standard deviation do I use?
What it looks like... • If a process uses 100% of a tolerance zone, Cp = 1.0 • If the distribution is not centered, the Cpk <1.0 Cpk = 1.0 Cpk <1.0
Target LSL USL Target LSL USL Cpk = 2.0 Cpk <2.0 What it looks like (cont.) • If a process uses 1/2 of the tolerance zone, the Cpk = 2.0 • If the process is not centered, the Cpk value would be <2.0 this stuff is so awesome
MEAN - LSL Cpk = 3s USL - MEAN Cpk = USL - LSL Cp = 3s 6s PROCESS CAPABILITY “Cp”, “CR” & “Cpk” Low Speed Limit High Speed Limit MEAN 1s 65 70 75 * * * 6 s Min CR = USL - LSL
Where do I improved? • Shape – control chart • Stabilize proces • Am I in control? 2. Spread – Cp Reduce variation Cp>1.33? 3. Location – Cpk Center process Cpk>1.33?
USL = 1.505 LSL = 1.500 s = .00045 CR = Cp = USL = .507 LSL = .506 s = .00006 CR = Cp = USL = 2800 PPH LSL = 2700 PPH Xbar = 2750 PPH s = 12.5PPH CR = Cp = Cpk = USL = 750 Mhz LSL = 735 Mhz Xbar = 740 Mhz s = 1.333Mhz CR = Cp = Cpk = USL = 1.503 LSL = 1.500 Xbar = 1.501 s = .00045 CR = Cp = Cpk = USL = .251 LSL = .250 Xbar = .250 s = .00015 CR = Cp = Cpk = Capability Indices exercise
Sigma Level (Zst value) • The number of standard deviations that would fit between the average value of the process and the closest tolerance limit • Very important in order to understand the amount of waste that is occurring Low Specification Limit High Specification Limit MEAN 65 70 75 s level = Cpk * 3 s capability = Cp * 3 6s level
Parts Per Million a.k.a. PPM • It’s difficult to understand the exact degree of improvement as the process gets better by capability measures • The PPM method considers the total amount of nonconforming parts produced by a process for its measure
Calculating PPM • PPM is the percentage of non-conforming parts multiplied by 1,000,000 • Example: A process produces 7% bad parts • PPM = (%bad) x 1,000,000 = .07 x 1,000,000 = 70,000 = 70,000 parts per million • Commitment to achieve 6 Sigma processes, which is a defect level of 3.4 PPM
Class exercise • Continue exercise on pg 594/602 • 8
What is Six Sigma? • Metric based on standard deviation • Vision • Benchmark • Philosophy • Methodology • Aggressive (Stretch) Goals 6s What does 3s or 6s feel like?
Number of Defects by Sigma Level • 6s = 3.4 defects per million • 5s = 233 defects per million • 4s = 6,210 defects per million • 3s = 66,807 defects per million *Based on a possible 1.5s shift See Table 6.5 on pg. 255 slevel = Cpk * 3
Summary • Remember! • Cp...... Larger is better • CR...... Smaller is better • Cpk.... Larger is better • PPM…Smaller is better • slevel…Larger is better Cp, CR, Cpk, s level, PPM, etc. are indices you can use to determine how well your process is performing