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1. Introduction to Auger Electron Spectroscopy (AES)MATSE 305 - November 23, 1998 Center for Microanalysis of Materials
Frederick Seitz Materials Research Laboratory
University of Illinois at Urbana-Champaign
2. What is Auger?
3. Why the Odd Name?
4. Surface Sensitivity
5. The Auger Process
6. Auger Energy Scale
7. AES Electron vs. X-ray Photon
8. Auger Stats
9. Auger Data Formats
10. AES Can Identify Elements
11. AES Sensitivity Factors
12. Peak Height / Quantitation
13. Additional Capabilities of Auger
14. Why UHV for Surface Analysis?
15. AES Instrument Configuration
16. Significance of Primary Beam
17. MRL Instrumentation
18. Sputtering Samples
19. Al/Pd/GaN Thin Film Example
20. Al/Pd/GaN Profile Data
21. Al/Pd/GaN Atomic Concentration Data
22. Area Specific Depth Profile Example
23. Summary of Surface Techniques